Quantitative compositional analysis of organic thin films using transmission NEXAFS spectroscopy in an X-ray microscope

2012 ◽  
Vol 185 (5-7) ◽  
pp. 119-128 ◽  
Author(s):  
Brian A. Collins ◽  
Harald Ade
Keyword(s):  
Thin Films ◽  
Compositional Analysis ◽  
Organic Thin Films ◽  
X Ray ◽  
Nexafs Spectroscopy

scholarly journals Transient Sub-nanosecond Soft X-ray NEXAFS Spectroscopy on Organic Thin Films

2020 ◽  
Vol 92 (23) ◽  
pp. 15611-15615
Author(s):  
Adrian Jonas ◽  
Katharina Dammer ◽  
Holger Stiel ◽  
Birgit Kanngiesser ◽  
Rocío Sánchez-de-Armas ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray ◽  
Nexafs Spectroscopy

scholarly journals Boosting Direct X‐Ray Detection in Organic Thin Films by Small Molecules Tailoring

2018 ◽  
Vol 29 (21) ◽  
pp. 1806119 ◽  
Author(s):  
Andrea Ciavatti ◽  
Laura Basiricò ◽  
Ilaria Fratelli ◽  
Stefano Lai ◽  
Piero Cosseddu ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Molecules ◽  
Organic Thin Films ◽  
X Ray

scholarly journals 3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (4) ◽  
pp. 259-264
Author(s):  
Kenji ISHIDA ◽  
Toshihisa HORIUCHI ◽  
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Organic Thin Films ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

Determination of dopant concentration in co-deposited organic thin films by using RBS and X-ray fluorescence combined techniques

2013 ◽  
Vol 35 (12) ◽  
pp. 2440-2443 ◽  
Author(s):  
Y.A. Paredes ◽  
E.G. Gravina ◽  
M.D. Barbosa ◽  
R. Machado ◽  
W.G. Quirino ◽  
...  
Keyword(s):  
Thin Films ◽  
Dopant Concentration ◽  
Organic Thin Films ◽  
X Ray

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Construction of a New VUV∕Soft X-ray Undulator Beamline BL-13A in the Photon Factory for Study of Organic Thin Films and Biomolecules Adsorbed on Surfaces

2010 ◽  
Author(s):  
Kazuhiko Mase ◽  
Akio Toyoshima ◽  
Takashi Kikuchi ◽  
Hirokazu Tanaka ◽  
Kenta Amemiya ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray ◽  
Photon Factory

scholarly journals Resonant soft x-ray reflectivity of organic thin films

2007 ◽  
Vol 25 (3) ◽  
pp. 575-586 ◽  
Author(s):  
Cheng Wang ◽  
Tohru Araki ◽  
Benjamin Watts ◽  
Shane Harton ◽  
Tadanori Koga ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray

X-ray Induced Modification of Semifluorinated Organic Thin Films†

2000 ◽  
Vol 104 (14) ◽  
pp. 3291-3297 ◽  
Author(s):  
Anthony J. Wagner ◽  
Keping Han ◽  
Amanda L. Vaught ◽  
D. Howard Fairbrother
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document