Electron energy loss spectroscopy for quantitative analysis of the local atomic structure of superthin oxide films on the surface of 3d-metals

2010 ◽  
Vol 182 (3) ◽  
pp. 115-126 ◽  
Author(s):  
D. Guy ◽  
O. Bakieva ◽  
V. Grebennikov ◽  
D. Surnin ◽  
Y. Ruts
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Electron Energy Loss Spectroscopy ◽  
Oxide Films ◽  
Local Atomic Structure ◽  
3D Metals ◽  
Electron Energy Loss

The Influence of Specimen Thickness in Quantitative Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 112-113
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Quantitative Analysis ◽  
Adverse Effects ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Light Element ◽  
Specimen Thickness ◽  
Element Analysis ◽  
Electron Energy Loss

The application of electron energy loss spectroscopy (EELS) to light element analysis is rapidly becoming an important aspect of the microcharacterization of solids in materials science, however relatively stringent requirements exist on the specimen thickness under which one can obtain EELS data due to the adverse effects of multiple inelastic scattering.1,2 This study was initiated to determine the limitations on quantitative analysis of EELS data due to specimen thickness.

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

Strain induced atomic structure at the Ir-doped LaAlO3/SrTiO3 interface

2017 ◽  
Vol 19 (42) ◽  
pp. 28676-28683 ◽  
Author(s):  
M. Lee ◽  
R. Arras ◽  
B. Warot-Fonrose ◽  
T. Hungria ◽  
M. Lippmaa ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Electron Energy Loss Spectroscopy ◽  
First Principles ◽  
Strain State ◽  
First Principles Calculations ◽  
Electron Energy Loss ◽  
Different Levels

Different levels of Ir doping at the LaAlO3/SrTiO3 interface affect the strain state in LaAlO3, as investigated using atomically resolved microscopy (HAADF-STEM), electron energy loss spectroscopy (EELS) and first-principles calculations (DFT).

scholarly journals Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

1994 ◽  
Vol 341 ◽  
Author(s):  
M. M. McGibbon ◽  
N. D. Browning ◽  
M. F. Chisholm ◽  
A. J. McGibbon ◽  
S. J. Pennycook ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Atomic Structure ◽  
Electron Energy Loss Spectroscopy ◽  
Atomic Scale ◽  
Chemical Information ◽  
Contrast Imaging ◽  
Z Contrast ◽  
Electron Energy Loss

AbstractThe macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models (1). Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale (2). The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface (3). In this paper we use the complimentary techniques of high resolution Zcontrast imaging and PEELS to investigate the atomic structure and chemistry of a 25° symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

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