Performance and application of a high energy monochromated Cu Kα1 X-ray source for the electron spectroscopy of materials

2005 ◽  
Vol 142 (2) ◽  
pp. 151-162 ◽  
Author(s):  
G. Beamson ◽  
S.R. Haines ◽  
N. Moslemzadeh ◽  
P. Tsakiropoulos ◽  
J.F. Watts ◽  
...  
Keyword(s):  
Electron Spectroscopy ◽  
High Energy ◽  
X Ray

HAXPES beamline PES-BL14 at the Indus-2 synchrotron radiation source

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Solid Samples ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Ccd Detector ◽  
Scientific Results

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.

High-energy monochromated Cu Kα1 x-ray source for electron spectroscopy of materials: initial results

2004 ◽  
Vol 36 (3) ◽  
pp. 275-279 ◽  
Author(s):  
G. Beamson ◽  
S. R. Haines ◽  
N. Moslemzadeh ◽  
P. Tsakiropoulos ◽  
P. Weightman ◽  
...  
Keyword(s):  
Electron Spectroscopy ◽  
High Energy ◽  
X Ray ◽  
Initial Results

High-energy resolution X-ray, gamma and electron spectroscopy with cryogenic detectors

2004 ◽  
Vol 60 (2-4) ◽  
pp. 363-368 ◽  
Author(s):  
M Loidl ◽  
E Leblanc ◽  
J Bouchard ◽  
T Branger ◽  
N Coron ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Cryogenic Detectors ◽  
High Energy Resolution ◽  
X Ray

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

Utilisation of High-Energy Heat Sources in Magnesium Alloy Surface Layer Treatment

2013 ◽  
Vol 58 (2) ◽  
pp. 619-624 ◽  
Author(s):  
M. Szafarska ◽  
J. Iwaszko ◽  
K. Kudła ◽  
I. Łegowik
Keyword(s):  
Surface Layer ◽  
Magnesium Alloy ◽  
Physicochemical Properties ◽  
Treatment Effectiveness ◽  
High Energy ◽  
Alloy Surface ◽  
Heat Sources ◽  
X Ray ◽  
Additional Equipment ◽  
Alloy Surface Layer

The main aim of the study was the evaluation of magnesium alloy surface treatment effectiveness using high-energy heat sources, i.e. a Yb-YAG Disk Laser and the GTAW method. The AZ91 and AM60 commercial magnesium alloys were subject to surface layer modification. Because of the physicochemical properties of the materials studied in case of the GTAW method, it was necessary to provide the welding stand with additional equipment. A novel two-torch set with torches operating in tandem was developed within the experiment. The effectiveness of specimen remelting using a laser and the GTAW method was verified based on macro- and microscopic examinations as well as in X-ray phase analysis and hardness measurements. In addition, the remelting parameters were optimised. The proposed treatment methodology enabled the achieving of the intended result and effective modification of a magnesium alloy surface layer.

Mesoscale structural characterization within bulk materials by high-energy X-ray microdiffraction

AIAA Journal ◽  
2001 ◽  
Vol 39 ◽  
pp. 919-923
Author(s):  
U. Lienert ◽  
H. F. Poulsen ◽  
A. Kvick
Keyword(s):  
Structural Characterization ◽  
High Energy ◽  
Bulk Materials ◽  
X Ray
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