High-energy monochromated Cu Kα1 x-ray source for electron spectroscopy of materials: initial results

2004 ◽  
Vol 36 (3) ◽  
pp. 275-279 ◽  
Author(s):  
G. Beamson ◽  
S. R. Haines ◽  
N. Moslemzadeh ◽  
P. Tsakiropoulos ◽  
P. Weightman ◽  
...  
Keyword(s):  
Electron Spectroscopy ◽  
High Energy ◽  
X Ray ◽  
Initial Results

scholarly journals Initial Results From a CdTe High-Energy X-ray Detector on a TEM

2016 ◽  
Vol 22 (S3) ◽  
pp. 312-313
Author(s):  
Hendrik O. Colijn ◽  
David W. McComb
Keyword(s):  
High Energy ◽  
X Ray ◽  
Initial Results

HAXPES beamline PES-BL14 at the Indus-2 synchrotron radiation source

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Solid Samples ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Ccd Detector ◽  
Scientific Results

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.

High-Resolution X-Ray Spectra of Capella: Initial Results from the [ITAL]Chandra[/ITAL] High-Energy Transmission Grating Spectrometer

2000 ◽  
Vol 539 (1) ◽  
pp. L41-L44 ◽  
Author(s):  
C. R. Canizares ◽  
D. P. Huenemoerder ◽  
D. S. Davis ◽  
D. Dewey ◽  
K. A. Flanagan ◽  
...  
Keyword(s):  
High Resolution ◽  
High Energy ◽  
Energy Transmission ◽  
X Ray ◽  
Transmission Grating ◽  
Grating Spectrometer ◽  
Initial Results

High-energy resolution X-ray, gamma and electron spectroscopy with cryogenic detectors

2004 ◽  
Vol 60 (2-4) ◽  
pp. 363-368 ◽  
Author(s):  
M Loidl ◽  
E Leblanc ◽  
J Bouchard ◽  
T Branger ◽  
N Coron ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Cryogenic Detectors ◽  
High Energy Resolution ◽  
X Ray

Performance and application of a high energy monochromated Cu Kα1 X-ray source for the electron spectroscopy of materials

2005 ◽  
Vol 142 (2) ◽  
pp. 151-162 ◽  
Author(s):  
G. Beamson ◽  
S.R. Haines ◽  
N. Moslemzadeh ◽  
P. Tsakiropoulos ◽  
J.F. Watts ◽  
...  
Keyword(s):  
Electron Spectroscopy ◽  
High Energy ◽  
X Ray

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

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