Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis

2004 ◽  
Vol 137-140 ◽  
pp. 757-761 ◽  
Author(s):  
A Oelsner ◽  
A Krasyuk ◽  
G.H Fecher ◽  
C.M Schneider ◽  
G Schönhense
Keyword(s):  
Electron Microscopy ◽  
Image Enhancement ◽  
Time Of Flight ◽  
Photoemission Electron Microscopy ◽  
Imaging Time ◽  
Photoemission Electron

Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis

2001 ◽  
Vol 480 (3) ◽  
pp. 180-187 ◽  
Author(s):  
G Schönhense ◽  
A Oelsner ◽  
O Schmidt ◽  
G.H Fecher ◽  
V Mergel ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Analysis ◽  
Time Of Flight ◽  
Photoemission Electron Microscopy ◽  
Chemical Surface ◽  
Photoemission Electron

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

scholarly journals Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Photoemission Electron Microscopy ◽  
2D Crystals ◽  
Photoemission Electron

scholarly journals Enabling Photoemission Electron Microscopy in Liquids via Graphene-Capped Microchannel Arrays

Nano Letters ◽  
2017 ◽  
Vol 17 (2) ◽  
pp. 1034-1041 ◽  
Author(s):  
Hongxuan Guo ◽  
Evgheni Strelcov ◽  
Alexander Yulaev ◽  
Jian Wang ◽  
Narayana Appathurai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
Microchannel Arrays ◽  
Photoemission Electron
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