Near edge X-ray absorption fine structure spectroscopy of chemically modified porous silicon

2004 ◽  
Vol 135 (2-3) ◽  
pp. 143-147 ◽  
Author(s):  
Y.F. Hu ◽  
R. Boukherroub ◽  
T.K. Sham
Langmuir ◽  
1993 ◽  
Vol 9 (12) ◽  
pp. 3441-3445 ◽  
Author(s):  
I. Coulthard ◽  
D. T. Jiang ◽  
J. W. Lorimer ◽  
T. K. Sham ◽  
X. H. Feng

1993 ◽  
Vol 298 ◽  
Author(s):  
S.L. Friedman ◽  
M.A. Marcus ◽  
D.L. Adler ◽  
Y.-H. Xie ◽  
T.D. Harris ◽  
...  

AbstractNear-edge-- and extended--x-ray absorption fine structure measurements, as well as luminescence excitation and emission spectra, were obtained from samples of porous Si and siloxene. Contrary to a recently proposed explanation for the room temperature luminescence in porous Si, the combined data indicate that siloxene is not principally responsible for the observed effect.


1992 ◽  
Vol 70 (10-11) ◽  
pp. 813-818 ◽  
Author(s):  
T. K. Sham ◽  
X. H. Feng ◽  
D. T. Jiang ◽  
B. X. Yang ◽  
J. Z. Xiong ◽  
...  

X-ray absorption fine structure (XAFS) spectra of porous Si prepared by the anodization of a Si wafer in aqueous HF solution have been obtained with synchrotron radiation. The Si K-edge near-edge X-ray absorption fine structure and extended X-ray absorption fine structures clearly show that porous silicon samples that have been exposed to the ambient environment (untreated) have an oxide layer, while the "clean" (treated) porous Si sample regenerated by HF treatment shows some degradation in its crystallinity. Noticeable differences in the XAFS between porous Si and crystalline Si are noted. The results and implications of this observation and the chemistry leading to the formation of surface oxygen compound are discussed.


2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  

Author(s):  
Kazumasa Murata ◽  
Junya Ohyama ◽  
Atsushi Satsuma

In the present study, the redispersion behavior of Ag particles on ZSM-5 in the presence of coke was observed using in situ X-ray absorption fine structure (XAFS) spectroscopy.


2021 ◽  
Author(s):  
Gregory M. Su ◽  
Han Wang ◽  
Brandon R. Barnett ◽  
Jeffrey R. Long ◽  
David Prendergast ◽  
...  

In situ near edge X-ray absorption fine structure spectroscopy directly probes unoccupied states associated with backbonding interactions between the open metal site in a metal–organic framework and various small molecule guests.


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