Computationally fast morphological descriptor-based microstructure reconstruction algorithms for particulate composites

2019 ◽  
Vol 182 ◽  
pp. 107746 ◽  
Author(s):  
Hangil You ◽  
Yeonghwan Kim ◽  
Gun Jin Yun
Keyword(s):  
Particulate Composites ◽  
Reconstruction Algorithms ◽  
Morphological Descriptor ◽  
Microstructure Reconstruction

Three dimensional deblurring of transmitted-light brightfield micrographs

1993 ◽  
Vol 51 ◽  
pp. 564-565
Author(s):  
Santosh Bhattacharyya
Keyword(s):  
Image Reconstruction ◽  
Three Dimensional ◽  
Transmitted Light ◽  
Reconstruction Algorithms ◽  
3D Image Reconstruction ◽  
Structural Details ◽  
Spread Function ◽  
Early Testing ◽  
Linearized Model ◽  
Image Reconstruction Algorithms

Three dimensional microscopic structures play an important role in the understanding of various biological and physiological phenomena. Structural details of neurons, such as the density, caliber and volumes of dendrites, are important in understanding physiological and pathological functioning of nervous systems. Even so, many of the widely used stains in biology and neurophysiology are absorbing stains, such as horseradish peroxidase (HRP), and yet most of the iterative, constrained 3D optical image reconstruction research has concentrated on fluorescence microscopy. It is clear that iterative, constrained 3D image reconstruction methodologies are needed for transmitted light brightfield (TLB) imaging as well. One of the difficulties in doing so, in the past, has been in determining the point spread function of the system.We have been developing several variations of iterative, constrained image reconstruction algorithms for TLB imaging. Some of our early testing with one of them was reported previously. These algorithms are based on a linearized model of TLB imaging.

X-Ray Nanotomography (XRMT) Tool for Non-Destructive High-Resolution Imaging of ICs

2001 ◽  
Author(s):  
Wenbing Yun ◽  
Steve Wang ◽  
David Scott ◽  
Kenneth W. Nill ◽  
Waleed S. Haddad
Keyword(s):  
High Resolution ◽  
Process Development ◽  
3D Visualization ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithms ◽  
X Ray ◽  
Visualization Software ◽  
Volumetric Reconstruction ◽  
Resolution Imaging ◽  
Non Destructive

Abstract A high-resolution table-sized x-ray nanotomography (XRMT) tool has been constructed that shows the promise of nondestructively imaging the internal structure of a full IC stack with a spatial resolution better than 100 nm. Such a tool can be used to detect, localize, and characterize buried defects in the IC. By collecting a set of X-ray projections through the full IC (which may include tens of micrometers of silicon substrate and several layers of Cu interconnects) and applying tomographic reconstruction algorithms to these projections, a 3D volumetric reconstruction can be obtained, and analyzed for defects using 3D visualization software. XRMT is a powerful technique that will find use in failure analysis and IC process development, and may facilitate or supplant investigations using SEM, TEM, and FIB tools, which generally require destructive sample preparation and a vacuum environment.

Multiscale damage plasticity modeling and inverse characterization for particulate composites

2020 ◽  
Vol 149 ◽  
pp. 103564 ◽  
Author(s):  
Hyoung Jun Lim ◽  
Hoil Choi ◽  
Fei-Yan Zhu ◽  
Tomas Webbe Kerekes ◽  
Gun Jin Yun
Keyword(s):  
Particulate Composites
Sign in / Sign up

Export Citation Format

Share Document