The flow of a thin conducting film over a spinning disc in the presence of an electric field

2006 ◽  
Vol 61 (12) ◽  
pp. 3838-3849 ◽  
Author(s):  
O.K. Matar ◽  
C.J. Lawrence
Keyword(s):  
Electric Field ◽  
Conducting Film ◽  
Thin Conducting ◽  
Thin Conducting Film ◽  
Spinning Disc

scholarly journals Interaction of an electromagnetic E-wave with a thin conducting film between two dielectric media in the case of an anisotropic isoenergetic surface and impurity scattering

2021 ◽  
Vol 2103 (1) ◽  
pp. 012156
Author(s):  
I A Kuznetsova ◽  
D N Romanov ◽  
A A Yushkanov
Keyword(s):  
Impurity Scattering ◽  
Charge Carriers ◽  
Surface Scattering ◽  
Conducting Film ◽  
Dielectric Media ◽  
Thin Conducting ◽  
Transmission And Absorption ◽  
Thin Conducting Film ◽  
The Magnetic Field ◽  
Isoenergetic Surface

Abstract The coefficients of reflection, transmission and absorption are calculated in the framework of the kinetic approach, when an electromagnetic E-wave interacts with a thin conducting film located between two dielectric media. To account for the surface scattering of charge carriers is used a model of mirror-diffuse boundary conditions, assuming that the specularity coefficients of the upper and lower surfaces of the film differ from each other. The electromagnetic wave falls on the upper surface of the film at an arbitrary angle. The case of an anisotropic isoenergetic surface of a conductor having the form of a three-axis ellipsoid, one of the main axes of which is parallel to the magnetic field strength of the wave, and the other is perpendicular to the film surfaces, is considered. The impurity scattering of electrons (holes) is dominated in the volume of the conductor. The dependence of the absorption coefficient on the parameters of the isoenergetic surface of the conductor is analyzed.

Resonance frequency shift in a cavity with a thin conducting film near a conducting wall

2007 ◽  
Vol 363 (1-2) ◽  
pp. 33-37 ◽  
Author(s):  
C. Braggio ◽  
G. Bressi ◽  
G. Carugno ◽  
A.V. Dodonov ◽  
V.V. Dodonov ◽  
...  
Keyword(s):  
Resonance Frequency ◽  
Frequency Shift ◽  
Conducting Film ◽  
Conducting Wall ◽  
Thin Conducting ◽  
Resonance Frequency Shift ◽  
Thin Conducting Film

Contactless Measurement of Thin Film Conductivity by a Microwave Compact Equipment

2003 ◽  
Vol 17 (08n09) ◽  
pp. 1904-1909
Author(s):  
Yang Ju ◽  
YO Hirosawa ◽  
Masumi Saka ◽  
Hiroyuki Abé
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Oxide Films ◽  
Contactless Measurement ◽  
Conducting Film ◽  
Glass Substrates ◽  
On Line ◽  
Thin Conducting Film ◽  
Tin Oxide Films ◽  
Film Conductivity

A method for contactless measurement of the conductivity of thin conducting film was demonstrated. In order to apply the technique to on-line testing, a large standoff distance of 35 mm was obtained by using a reflector focusing sensor. The measurement was preformed by using a microwave compact equipment working at 94 GHz which was developed for decreasing the system cost. Indium Tin Oxide films having conductivity of 8.2 × 104 ~ 6.6 × 105 S/m on the glass substrates were used as the samples. Evaluation equation for determining the conductivity of Indium Tin Oxide films was generated.

Electric field induced dewetting and pattern formation in thin conducting polymer film

2010 ◽  
Vol 144 (1) ◽  
pp. 170-175 ◽  
Author(s):  
S. Manigandan ◽  
Saptarshi Majumder ◽  
A. Suresh ◽  
Saibal Ganguly ◽  
Kajari Kargupta ◽  
...  
Keyword(s):  
Pattern Formation ◽  
Electric Field ◽  
Polymer Film ◽  
Conducting Polymer ◽  
Thin Conducting
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