In situ real-time study buckling behavior of boron nitride nanotubes with axial compression by TEM

2019 ◽  
Vol 30 (7) ◽  
pp. 1401-1404 ◽  
Author(s):  
Guoxin Chen ◽  
Huanming Lu ◽  
Junfeng Cui ◽  
Haitao Yu ◽  
Bo Wang ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Real Time ◽  
Axial Compression ◽  
Boron Nitride Nanotubes ◽  
Time Study ◽  
Buckling Behavior

scholarly journals An in situ and real time study of the formation of CdSe NCs

Nanoscale ◽  
2020 ◽  
Vol 12 (45) ◽  
pp. 22928-22934
Author(s):  
Cristina Palencia ◽  
Robert Seher ◽  
Jan Krohn ◽  
Felix Thiel ◽  
Felix Lehmkühler ◽  
...  
Keyword(s):  
Real Time ◽  
Time Study

In situ studies are crucial to demonstrate that magic-size clusters are always intermediates in the formation of regular NCs.

Molecular Dynamics Simulation of the Buckling Behavior of Boron Nitride Nanotubes under Uniaxial Compressive Loading

2010 ◽  
Vol 297-301 ◽  
pp. 984-989 ◽  
Author(s):  
S. Ebrahimi-Nejad ◽  
Ali Shokuhfar ◽  
A. Zare-Shahabadi
Keyword(s):  
Boron Nitride ◽  
Compressive Loading ◽  
Pair Potential ◽  
Md Simulations ◽  
Boron Nitride Nanotubes ◽  
Dynamics Simulation ◽  
Buckling Loads ◽  
Buckling Behavior ◽  
Bond Stretching ◽  
Different Diameters

Boron Nitride nanotubes (BNNTs) together with carbon nanotubes (CNTs) have attracted the wide attention of the scientific community and have been considered as promising materials due to their unique structural and physical properties. In this paper, the behavior of BNNTs of different diameters under compressive loading has been studied through molecular dynamic (MD) simulations. We have used a Lennard-Jones pair potential to characterize the interactions between non-bonded atoms and harmonic potentials for bond stretching and bond angle vibrations. Results of the MD simulations determine the critical buckling loads of the BNNTs of various diameters under uniaxial compression, and indicate that for the simulated BNNTs of length L = 6 nm, the critical buckling loads increase by increasing the nanotube diameters.

scholarly journals Direct Observation of Inner-Layer Inward Contractions of Multiwalled Boron Nitride Nanotubes upon in Situ Heating

Nanomaterials ◽  
2018 ◽  
Vol 8 (2) ◽  
pp. 86 ◽  
Author(s):  
Zhongwen Li ◽  
Zi-An Li ◽  
Shuaishuai Sun ◽  
Dingguo Zheng ◽  
Hong Wang ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Direct Observation ◽  
Boron Nitride Nanotubes ◽  
In Situ Heating

Validation of a newly developed FTIR in situ reactor: Real time study of photocatalytic degradation of nitric oxide

2010 ◽  
Vol 53 (6) ◽  
pp. 469-473 ◽  
Author(s):  
Birger Hauchecorne ◽  
Tom Tytgat ◽  
Dieter Terrens ◽  
Floris Vanpachtenbeke ◽  
Silvia Lenaerts
Keyword(s):  
Nitric Oxide ◽  
Photocatalytic Degradation ◽  
Real Time ◽  
Time Study

Mechanical Properties of Bamboo-like Boron Nitride Nanotubes by In Situ TEM and MD Simulations: Strengthening Effect of Interlocked Joint Interfaces

ACS Nano ◽  
2011 ◽  
Vol 5 (9) ◽  
pp. 7362-7368 ◽  
Author(s):  
Dai-Ming Tang ◽  
Cui-Lan Ren ◽  
Xianlong Wei ◽  
Ming-Sheng Wang ◽  
Chang Liu ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Boron Nitride ◽  
Md Simulations ◽  
Boron Nitride Nanotubes ◽  
In Situ Tem ◽  
Strengthening Effect

In situ real‐time study of chemical etching process of Si(100) using light scattering

1996 ◽  
Vol 69 (2) ◽  
pp. 221-223 ◽  
Author(s):  
Y.‐P. Zhao ◽  
Y.‐J. Wu ◽  
H.‐N. Yang ◽  
G.‐C. Wang ◽  
T.‐M. Lu
Keyword(s):  
Light Scattering ◽  
Real Time ◽  
Chemical Etching ◽  
Etching Process ◽  
Time Study

Real Time Ellipsometric Study of Boron Nitride Thin Film Growth

1995 ◽  
Vol 410 ◽  
Author(s):  
E. Bertran ◽  
A. Canillas ◽  
J. Campmany ◽  
M. El Kasmi ◽  
E. Pascual ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Boron Nitride ◽  
Real Time ◽  
Film Growth ◽  
Thin Film Growth ◽  
Si Substrates ◽  
Rf Glow Discharge

ABSTRACTWe present an in situ study of the growth of boron nitride thin films by real time ellipsometry. Films were produced in a PECVD reactor by rf glow discharge decomposition of ammonia (pure) and diborane (1% in hydrogen), on Ni-Cr coated c-Si substrates placed either on the powered electrode or on the grounded electrode of the reactor. A fast phase-modulated ellipsometer performed the real time monitoring of the growth processes at 350 nm. The ellipsometric angle trayectories were obtained through an autocalibrated method, especially suitable for the in situ optical analysis of transparent thin films. We applied several thin film growth optical models (homogeneous, two-layer, surface roughness) to analyze parameters of the films such as refractive index, extinction coefficient, roughness and deposition rate. In all the cases studied, the two-layer model fits well with the ellipsometric measurements, but a more sofisticated model considering a variable refractive index could better describe these films.

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