Electrical transport properties of Au/SiO2/n-GaN MIS structure in a wide temperature range
2012 ◽
Vol 12
(3)
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pp. 765-772
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2020 ◽
Vol 12
(14)
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pp. 16630-16638
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2019 ◽
Vol 790
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pp. 240-247
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1993 ◽
Vol 07
(20)
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pp. 1295-1299
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