Nanoscale aggregation phenomena at the contact line of air-drying pure water droplets on silicon revealed by atomic force microscopy

2009 ◽  
Vol 9 (1) ◽  
pp. 48-58 ◽  
Author(s):  
A. Méndez-Vilas ◽  
A.B. Jódar-Reyes ◽  
J. Díaz ◽  
M.L. González-Martín
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Line ◽  
Pure Water ◽  
Water Droplets ◽  
Air Drying ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregation Phenomena

Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

scholarly journals Magnesium-Free Immobilization of DNA Origami Nanostructures at Mica Surfaces for Atomic Force Microscopy

Molecules ◽  
2021 ◽  
Vol 26 (16) ◽  
pp. 4798
Author(s):  
Yang Xin ◽  
Amir Ardalan Zargariantabrizi ◽  
Guido Grundmeier ◽  
Adrian Keller
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Pure Water ◽  
Dna Origami ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Individual ◽  
Individual Strategies ◽  
Phosphate Buffered Saline

DNA origami nanostructures (DONs) are promising substrates for the single-molecule investigation of biomolecular reactions and dynamics by in situ atomic force microscopy (AFM). For this, they are typically immobilized on mica substrates by adding millimolar concentrations of Mg2+ ions to the sample solution, which enable the adsorption of the negatively charged DONs at the like-charged mica surface. These non-physiological Mg2+ concentrations, however, present a serious limitation in such experiments as they may interfere with the reactions and processes under investigation. Therefore, we here evaluate three approaches to efficiently immobilize DONs at mica surfaces under essentially Mg2+-free conditions. These approaches rely on the pre-adsorption of different multivalent cations, i.e., Ni2+, poly-l-lysine (PLL), and spermidine (Spdn). DON adsorption is studied in phosphate-buffered saline (PBS) and pure water. In general, Ni2+ shows the worst performance with heavily deformed DONs. For 2D DON triangles, adsorption at PLL- and in particular Spdn-modified mica may outperform even Mg2+-mediated adsorption in terms of surface coverage, depending on the employed solution. For 3D six-helix bundles, less pronounced differences between the individual strategies are observed. Our results provide some general guidance for the immobilization of DONs at mica surfaces under Mg2+-free conditions and may aid future in situ AFM studies.

Atomic force microscopy: influence of air drying and fixation on the morphology and viscoelasticity of cultured cells

1998 ◽  
Vol 189 (2) ◽  
pp. 172-180 ◽  
Author(s):  
Weyn ◽  
Kalle ◽  
Kumar‐Singh ◽  
Van Marck ◽  
Tanke ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cultured Cells ◽  
Air Drying ◽  
Force Microscopy ◽  
Atomic Force

Contact Angle Measurement Through Atomic Force Microscopy

2011 ◽  
Author(s):  
Jiapeng Yu ◽  
Hao Wang
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Contact Line ◽  
Contact Angles ◽  
Angle Measurement ◽  
Optical Methods ◽  
Phase Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Three Phase

Understanding the structure near the three-phase contact line is critical for a comprehensive understanding of the thin-film region when a liquid partially wets a planer substrate. Despite numerous theoretical and simulation efforts found literature, an accurate experiment is difficult to conduct because of how small its scale. In the present work the accurate geometry of the region near the three-phase contact line was obtained by directly scanning the thin-film region with atomic force microscopy (AFM). The contact angles were directly extracted from the results and compared with the ones measured from traditional optical methods.

scholarly journals Physical characterisation of microporous and nanoporous polymer films by atomic force microscopy, scanning electron microscopy and high speed video microphotography

2004 ◽  
Vol 18 (4) ◽  
pp. 577-585 ◽  
Author(s):  
M. S. Barrow ◽  
R. L. Jones ◽  
J. O. Park ◽  
M. Srinivasarao ◽  
P. R. Williams ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Polymer Solution ◽  
Polymer Films ◽  
High Speed ◽  
Water Droplets ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

We report studies of ordered microporous and nanoporous polymer films formed by the evaporation of polymer solutions following exposure to a humid atmosphere. High speed microphotographic (HSMP) studies of the formation process showed that near the surface of the polymer solution, vapour condensation produced near mono-disperse water droplets which form a close-packed monolayer (or ‘breath figure’). Following the evaporation of the solvent, characterisation of the solid by Atomic Force Microscopy and Scanning Electron Microscopy revealed that the surface of the polymer film is characterised by extensive regions of hexagonally close-packed microscopic pores, whose spatial arrangement replicates that of the initial droplet monolayer. Characterisation of sections of the film by Atomic Force Microscopy established that the surficial pores represent open sections of sub-surficial spheroidal cavities formed by encapsulation of the water droplets within the polymer solution. An interesting feature of the results is the occurrence of nano-scale pores at the film surface and at (and within) the walls of the sub-surficial microscopic pores. This is the first physical evidence report of such features in porous polymer films produced by a process involving breath-figures. Their dimensions suggest that more detailed structural investigations will require alternative techniques to conventional, optical methods.

Nanoparticle deposits near the contact line of pinned volatile droplets: size and shape revealed by atomic force microscopy

Soft Matter ◽  
2011 ◽  
Vol 7 (9) ◽  
pp. 4152 ◽  
Author(s):  
Alexandros Askounis ◽  
Daniel Orejon ◽  
Vasileios Koutsos ◽  
Khellil Sefiane ◽  
Martin E. R. Shanahan
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Line ◽  
Force Microscopy ◽  
Size And Shape ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document