Chemical state analysis of heavily phosphorus-doped epitaxial silicon films grown on Si (1 0 0) by X-ray photoelectron spectroscopy

2018 ◽  
Vol 443 ◽  
pp. 131-137 ◽  
Author(s):  
Minhyeong Lee ◽  
Sungtae Kim ◽  
Dae-Hong Ko
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical State ◽  
Silicon Films ◽  
Epitaxial Silicon ◽  
X Ray ◽  
Phosphorus Doped ◽  
State Analysis

Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)

1980 ◽  
Vol 19 (7) ◽  
pp. L349-L352 ◽  
Author(s):  
Naoto Koshizaki ◽  
Masahiro Kudo ◽  
Masanori Owari ◽  
Yoshimasa Nihei ◽  
Hitoshi Kamada
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical State ◽  
X Ray ◽  
Heat Treated ◽  
State Analysis

scholarly journals Chemical State Analysis of Si-Doped CNT on SiC by Hard X-Ray Photoelectron Spectroscopy

2011 ◽  
Vol 9 ◽  
pp. 54-57 ◽  
Author(s):  
Jin-Young Son ◽  
Masatake Machida ◽  
Hiroshi Oji ◽  
Yoshio Watanabe ◽  
Takehiro Maruyama ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical State ◽  
X Ray ◽  
Si Doped ◽  
State Analysis

In situ chemical state analysis of buried polymer/metal adhesive interface by hard X-ray photoelectron spectroscopy

2014 ◽  
Vol 320 ◽  
pp. 177-182 ◽  
Author(s):  
Kenichi Ozawa ◽  
Takashi Kakubo ◽  
Katsunori Shimizu ◽  
Naoya Amino ◽  
Kazuhiko Mase ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical State ◽  
X Ray ◽  
Adhesive Interface ◽  
Polymer Metal ◽  
State Analysis

The Non-destructive Chemical State Analysis of Al-Cu Intermetallic Compound by Ultra-soft X-ray Spectrometer with Al L-alpha.

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
T Ogiwara ◽  
T Kimura ◽  
S Fukushima ◽  
K Tsukamoto ◽  
T Tazawa ◽  
...  
Keyword(s):  
Intermetallic Compound ◽  
Chemical State ◽  
X Ray ◽  
Non Destructive ◽  
State Analysis

Chemical state analysis of vanadium by high resolution X-ray spectroscopy

1975 ◽  
Vol 4 (3) ◽  
pp. 117-118 ◽  
Author(s):  
Y. Gohshi ◽  
T. Nakamura ◽  
M. Yoshimura
Keyword(s):  
High Resolution ◽  
Chemical State ◽  
X Ray ◽  
State Analysis
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