Quantification of Staphylococcus aureus adhesion forces on various dental restorative materials using atomic force microscopy

2016 ◽  
Vol 379 ◽  
pp. 323-330 ◽  
Author(s):  
Abderrahmen Merghni ◽  
Dorra Kammoun ◽  
Hajer Hentati ◽  
Sébastien Janel ◽  
Michka Popoff ◽  
...  
Keyword(s):  
Staphylococcus Aureus ◽  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dental Restorative Materials ◽  
Restorative Materials ◽  
Dental Restorative

Nanoscale adhesion forces between the fungal pathogen Candida albicans and macrophages

2016 ◽  
Vol 1 (1) ◽  
pp. 69-74 ◽  
Author(s):  
Sofiane El-Kirat-Chatel ◽  
Yves F. Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Candida Albicans ◽  
Immune Cells ◽  
Fungal Pathogen ◽  
Fungal Pathogens ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

We establish atomic force microscopy as a new nanoscopy platform for quantifying the forces between fungal pathogens and immune cells.

scholarly journals 3D Surface Profile and Color Stability of Tooth Colored Filling Materials after Bleaching

2015 ◽  
Vol 2015 ◽  
pp. 1-9 ◽  
Author(s):  
Bryant Anthony Irawan ◽  
Stacey Natalie Irawan ◽  
Sam’an Malik Masudi ◽  
Ninin Sukminingrum ◽  
Mohammad Khursheed Alam
Keyword(s):  
Surface Profile ◽  
Color Stability ◽  
Tooth Bleaching ◽  
Force Microscopy ◽  
Color Changes ◽  
Filling Materials ◽  
Atomic Force ◽  
3D Surface ◽  
Restorative Materials ◽  
Dental Restorative

This study aims to evaluate the effects of vital tooth bleaching with carbamide peroxide home bleaching and in-office bleaching on the color stability and 3D surface profile of dental restorative filling materials. Thirty discs (n=30) measure 6 mm in diameter and 2 mm thick for each of three restorative materials. These are nanofilled composite Filtek Z350 XT, the submicron composite EsteliteΣQuick, and nanofilled glass ionomer Ketac N100 nanoionomer and were fabricated in shade A2. Each group was further divided into three subgroups (n=10): subgroup A (Opalescence PF), subgroup B (Opalescence Boost in-office bleaching), and subgroup C (distilled water) serving as control. Samples were bleached according to the manufacturer’s instructions for a period of two weeks. The Commission Internationale de L’Eclairage (CIEL*,a*,b*) system was chosen for image processing, while 3D surface profile was tested with atomic force microscopy (AFM). Statistical analyses were performed with the Mann-Whitney tests and Krusal-Wallis with aPvalue of ≤0.05. The three restorative materials showed significant color changes (ΔE);P≤0.05. In diminishing order, the mean color changes recorded were EsteliteΣ(3.82 ± 1.6) > Ketac Nano (2.97 ± 1.2) > Filtek Z350 XT (2.25 ± 1.0). However, none of the tested materials showed statistically significant changes in surface roughness;P>0.05.

scholarly journals A modular atomic force microscopy approach reveals a large range of hydrophobic adhesion forces among bacterial members of the leaf microbiota

2019 ◽  
Vol 13 (7) ◽  
pp. 1878-1882 ◽  
Author(s):  
Maximilian Mittelviefhaus ◽  
Daniel B. Müller ◽  
Tomaso Zambelli ◽  
Julia A. Vorholt
Keyword(s):  
Atomic Force Microscopy ◽  
Large Range ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

Imaging the surface of Staphylococcus aureus by atomic force microscopy

Apmis ◽  
2001 ◽  
Vol 109 (7-8) ◽  
pp. 541-545 ◽  
Author(s):  
TORE TOLLERSRUD ◽  
TORUNN BERGE ◽  
SVEIN RUNE ANDERSEN ◽  
ARVE LUND
Keyword(s):  
Staphylococcus Aureus ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Antibacterial Activity of Dental Restorative Materials

1971 ◽  
Vol 50 (2) ◽  
pp. 382-387 ◽  
Author(s):  
David M. Updegraff ◽  
Robert W.H. Chang ◽  
Richard W. Joos
Keyword(s):  
Staphylococcus Aureus ◽  
Antibacterial Activity ◽  
Bacillus Subtilis ◽  
Lactobacillus Plantarum ◽  
Bacteriostatic Activity ◽  
Dental Restorative Materials ◽  
Restorative Materials ◽  
Mixed Bacteria ◽  
Dental Restorative

Twenty-one commercial dental restorative materials, aged under various conditions, were checked on two different culture mediums for their antibacterial activity against Staphylococcus aureus, Bacillus subtilis, Lactobacillus plantarum, a cariogenic streptococcus, and mixed bacteria from the mouth. The duration of bacteriostatic activity was decreased rapidly by leaching in water. Of the three acrylics checked for ability to prevent in vitro carieslike lesions, the acrylic with highest antibacterial activity had the least caries.

scholarly journals Atomic Force Microscopy of Cell Growth and Division in Staphylococcus aureus

2004 ◽  
Vol 186 (11) ◽  
pp. 3286-3295 ◽  
Author(s):  
Ahmed Touhami ◽  
Manfred H. Jericho ◽  
Terry J. Beveridge
Keyword(s):  
Staphylococcus Aureus ◽  
Atomic Force Microscopy ◽  
Cell Wall ◽  
Cross Wall ◽  
Adhesive Properties ◽  
Reactive Material ◽  
Force Microscopy ◽  
Additional Information ◽  
Atomic Force ◽  
Sequential Images

ABSTRACT The growth and division of Staphylococcus aureus was monitored by atomic force microscopy (AFM) and thin-section transmission electron microscopy (TEM). A good correlation of the structural events of division was found using the two microscopies, and AFM was able to provide new additional information. AFM was performed under water, ensuring that all structures were in the hydrated condition. Sequential images on the same structure revealed progressive changes to surfaces, suggesting the cells were growing while images were being taken. Using AFM small depressions were seen around the septal annulus at the onset of division that could be attributed to so-called murosomes (Giesbrecht et al., Arch. Microbiol. 141:315-324, 1985). The new cell wall formed from the cross wall (i.e., completed septum) after cell separation and possessed concentric surface rings and a central depression; these structures could be correlated to a midline of reactive material in the developing septum that was seen by TEM. The older wall, that which was not derived from a newly formed cross wall, was partitioned into two different surface zones, smooth and gel-like zones, with different adhesive properties that could be attributed to cell wall turnover. The new and old wall topographies are equated to possible peptidoglycan arrangements, but no conclusion can be made regarding the planar or scaffolding models.

Adhesion Forces between LewisX Determinant Antigens as Measured by Atomic Force Microscopy

2001 ◽  
Vol 40 (16) ◽  
pp. 3052-3055 ◽  
Author(s):  
Christophe Tromas ◽  
Javier Rojo ◽  
Jesús M. de la Fuente ◽  
Africa G. Barrientos ◽  
Ricardo García ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force
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