scholarly journals Atomic layer deposition and characterization of stoichiometric erbium oxide thin dielectrics on Si(100) using (CpMe)3Er precursor and ozone

2012 ◽  
Vol 258 (22) ◽  
pp. 8514-8520 ◽  
Author(s):  
Runshen Xu ◽  
Qian Tao ◽  
Yi Yang ◽  
Christos G. Takoudis
2010 ◽  
Vol 157 (10) ◽  
pp. G193 ◽  
Author(s):  
Aile Tamm ◽  
Marianna Kemell ◽  
Jekaterina Kozlova ◽  
Timo Sajavaara ◽  
Massimo Tallarida ◽  
...  

2010 ◽  
Vol 519 (2) ◽  
pp. 666-673 ◽  
Author(s):  
Aile Tamm ◽  
Mikko Heikkilä ◽  
Marianna Kemell ◽  
Jekaterina Kozlova ◽  
Kaupo Kukli ◽  
...  

2021 ◽  
Vol 1762 (1) ◽  
pp. 012041
Author(s):  
K Buchkov ◽  
A Galluzzi ◽  
B Blagoev ◽  
A Paskaleva ◽  
P Terziyska ◽  
...  

2020 ◽  
Vol 694 ◽  
pp. 137740 ◽  
Author(s):  
Mostafa Afifi Hassan ◽  
Aadil Waseem ◽  
Muhammad Ali Johar ◽  
Sou Young Yu ◽  
June Key Lee ◽  
...  

2014 ◽  
Vol 20 (7-8-9) ◽  
pp. 217-223 ◽  
Author(s):  
Timothee Blanquart ◽  
Mikko Kaipio ◽  
Jaakko Niinistö ◽  
Marco Gavagnin ◽  
Valentino Longo ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document