Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

2010 ◽  
Vol 256 (22) ◽  
pp. 6612-6617 ◽  
Author(s):  
Azadeh Farahzadi ◽  
Maryam Beigmohamadi ◽  
Phenwisa Niyamakom ◽  
Stephan Kremers ◽  
Nico Meyer ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Organic Thin Films

Characterization of organic thin films for OLEDs using spectroscopic ellipsometry

1997 ◽  
Vol 26 (4) ◽  
pp. 366-371 ◽  
Author(s):  
Francis G. Celii ◽  
Tracy B. Harton ◽  
O.Faye Phillips
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Organic Thin Films

Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-Optical Kerr Effect Spectroscopy

2012 ◽  
Vol 48 (11) ◽  
pp. 2777-2780 ◽  
Author(s):  
Michael Fronk ◽  
Christian Schubert ◽  
Francisc Haidu ◽  
Camelia Scarlat ◽  
Kathrin Dorr ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Kerr Effect ◽  
Organic Thin Films ◽  
Optical Kerr Effect ◽  
Magneto Optical Kerr Effect

Determination of dopant concentration in co-deposited organic thin films by using RBS and X-ray fluorescence combined techniques

2013 ◽  
Vol 35 (12) ◽  
pp. 2440-2443 ◽  
Author(s):  
Y.A. Paredes ◽  
E.G. Gravina ◽  
M.D. Barbosa ◽  
R. Machado ◽  
W.G. Quirino ◽  
...  
Keyword(s):  
Thin Films ◽  
Dopant Concentration ◽  
Organic Thin Films ◽  
X Ray

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

Characterization of SiN thin films with spectroscopic ellipsometry

1993 ◽  
Vol 185 (1-4) ◽  
pp. 342-347 ◽  
Author(s):  
J. Petalas ◽  
S. Logothetidis ◽  
A. Markwitz ◽  
E.C. Paloura ◽  
R.L. Johnson ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

Optical spectroscopy characterization of zinc tetra pyridel porphine (ZnTPyP) organic thin films

2018 ◽  
Vol 106 ◽  
pp. 136-144 ◽  
Author(s):  
M.M. Shehata ◽  
H. Kamal ◽  
H.M. Hasheme ◽  
M.M. El-Nahass ◽  
K. Abdelhady
Keyword(s):  
Thin Films ◽  
Optical Spectroscopy ◽  
Organic Thin Films

Grazing-incidence X-Ray Analysis of Surfaces and Thin Films

1991 ◽  
Vol 35 (A) ◽  
pp. 143-150 ◽  
Author(s):  
T. C. Huang
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
Bragg Diffraction ◽  
Interface Roughness ◽  
Phase Identification ◽  
X Ray ◽  
Types Of Information

AbstractGrazing-incidence X-ray analysis techniques which are commonly used for the nondestructive characterization of surfaces and thin films are reviewed. The X-ray reflectivity technicue is used to study surface uniformity and oxidation, layer thickness and density, interface roughness and diffusion, etc. The grazing-incidence in-plane diffraction technique is used to determine in-plane crystallography of epitaxial films. The grazing-incidence asymmetric-Bragg diffraction is used for surface phase identification and structural depth profiling determination of polycrystalline films. Typical examples to illustrate the types of information that can be obtained by the techniques are presented.

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