Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment

2010 ◽  
Vol 256 (21) ◽  
pp. 6259-6261 ◽  
Author(s):  
Yow-Jon Lin ◽  
Yi-Min Chin ◽  
Jung-Chung Lin ◽  
Yu-Chao Su
2004 ◽  
Vol 95 (11) ◽  
pp. 6273-6276 ◽  
Author(s):  
Jianqiao Hu ◽  
Jisheng Pan ◽  
Furong Zhu ◽  
Hao Gong

2003 ◽  
Vol 796 ◽  
Author(s):  
Hu Jianqiao ◽  
Pan Jisheng ◽  
Furong Zhu ◽  
Gong Hao

ABSTRACTThe surface electronic properties of the nitric oxide (NO) treated indium tin oxide (ITO) are examined in-situ by a four-point probe and X-ray photoelectron spectroscopy (XPS). The XPS N1s peak emerged at a high binding energy of 404 eV indicating that NO is reactive with ITO. NO adsorption induces an increase of film sheet resistance, arising from an oxygen rich layer near the ITO surface region, with approximately 2.5 nm thick. This implies that the interaction of NO with ITO is occurred around surface region. Valence band maximum measured for NO-absorbed ITO was shifted to the low binding energy side. This is related to the upward surface band bending.


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