X-ray diffraction and photoelectron spectroscopy study of swift heavy ion irradiated Mn/p-Si structure

2010 ◽  
Vol 256 (6) ◽  
pp. 1664-1667 ◽  
Author(s):  
M.K. Srivastava ◽  
T. Shripathi ◽  
D.M. Phase ◽  
P.C. Srivastava
Keyword(s):  
Photoelectron Spectroscopy ◽  
Heavy Ion ◽  
Spectroscopy Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Swift Heavy Ion

Multi-scale Investigation of Heterogeneous Swift Heavy Ion Tracks in Stannate Pyrochlore

2021 ◽  
Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Modifications ◽  
Multi Scale ◽  
Ion Tracks ◽  
Swift Heavy Ion ◽  
Transmission Electron

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...

scholarly journals Online in situ x-ray diffraction setup for structural modification studies during swift heavy ion irradiation

2012 ◽  
Vol 83 (1) ◽  
pp. 013902 ◽  
Author(s):  
C. Grygiel ◽  
H. Lebius ◽  
S. Bouffard ◽  
A. Quentin ◽  
J. M. Ramillon ◽  
...  
Keyword(s):  
Structural Modification ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
Swift Heavy Ion Irradiation ◽  
X Ray ◽  
Heavy Ion Irradiation ◽  
Swift Heavy Ion

X-ray diffraction study of the damage induced in yttria-stabilized zirconia by swift heavy ion irradiations

2008 ◽  
Vol 104 (7) ◽  
pp. 073504 ◽  
Author(s):  
Jean-Marc Costantini ◽  
François Guillet ◽  
Sébastien Lambert ◽  
Dominique Grébille ◽  
François Beuneu ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Heavy Ion ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Swift Heavy Ion

SWIFT HEAVY ION INDUCED NANOHILL FORMATION ON THE SURFACE OF GaP

2011 ◽  
Vol 10 (01n02) ◽  
pp. 105-109 ◽  
Author(s):  
R. L. DUBEY ◽  
S. K. DUBEY ◽  
A. D. YADAV ◽  
D. KANJILAL
Keyword(s):  
Atomic Force Microscopy ◽  
Crystallite Size ◽  
Gallium Phosphide ◽  
Phonon Mode ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Swift Heavy Ion

Gallium phosphide ( GaP ) samples were irradiated with swift (100 MeV)56 Fe 9+ ions for various ion fluences varying from 1 × 1011 to 1 × 1014 cm -2. Atomic force microscopy, Raman scattering, and X-ray diffraction techniques have been used to investigate the irradiation effect. Atomic force microscopy studies showed the presence of nanosized hills separated with valleys at the surface of irradiated gallium phosphide. The average diameters of hills were found to be 19.76, 19.81, 20.70, and 22.64 nm for ion fluences 5 × 1012, 1 × 1013, 5 × 1013, and 1 × 1014 cm -2, respectively. Root mean square surface roughness analysis has been used to characterize the nature of the surface under swift heavy ion irradiation. The features observed in the Raman spectra at 402.18 cm-1 and 365.05 cm-1 were assigned to the characteristic first-order longitudinal optical (LO) phonon mode and transverse optical (TO) phonon mode of gallium phosphide, respectively. We have also observed the second-order overtones and combinations of optical modes giving rise to three characteristic peaks in the region between 700 and 800 cm-1. X-ray diffraction technique has been used to determine the crystallite size. The crystallite size was found to decrease with increase in ion fluence.

Setup for in situ x-ray diffraction study of swift heavy ion irradiated materials

2007 ◽  
Vol 78 (11) ◽  
pp. 113901 ◽  
Author(s):  
P. K. Kulriya ◽  
F. Singh ◽  
A. Tripathi ◽  
R. Ahuja ◽  
A. Kothari ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Swift Heavy Ion

scholarly journals In situdefect annealing of swift heavy ion irradiated CeO2and ThO2using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell

2015 ◽  
Vol 48 (3) ◽  
pp. 711-717 ◽  
Author(s):  
Raul I. Palomares ◽  
Cameron L. Tracy ◽  
Fuxiang Zhang ◽  
Changyong Park ◽  
Dmitry Popov ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Ambient Pressure ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Measurement Capability ◽  
Swift Heavy Ion ◽  
Diamond Anvil ◽  
Defect Recovery

Hydrothermal diamond anvil cells (HDACs) provide facile means for coupling synchrotron X-ray techniques with pressure up to 10 GPa and temperature up to 1300 K. This manuscript reports on an application of the HDAC as an ambient-pressure sample environment for performingin situdefect annealing and thermal expansion studies of swift heavy ion irradiated CeO2and ThO2using synchrotron X-ray diffraction. The advantages of thein situHDAC technique over conventional annealing methods include rapid temperature ramping and quench times, high-resolution measurement capability, simultaneous annealing of multiple samples, and prolonged temperature and apparatus stability at high temperatures. Isochronal annealing between 300 and 1100 K revealed two-stage and one-stage defect recovery processes for irradiated CeO2and ThO2, respectively, indicating that the morphology of the defects produced by swift heavy ion irradiation of these two materials differs significantly. These results suggest that electronic configuration plays a major role in both the radiation-induced defect production and high-temperature defect recovery mechanisms of CeO2and ThO2.

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