Cesium redeposition artifacts during low energy ToF-SIMS depth profiling

R.G. Vitchev; J. Brison; L. Houssiau

doi:10.1016/j.apsusc.2009.04.033

Cesium redeposition artifacts during low energy ToF-SIMS depth profiling

Applied Surface Science ◽

10.1016/j.apsusc.2009.04.033 ◽

2009 ◽

Vol 255 (17) ◽

pp. 7586-7589 ◽

Cited By ~ 4

Author(s):

R.G. Vitchev ◽

J. Brison ◽

L. Houssiau

Keyword(s):

Depth Profiling ◽

Low Energy ◽

Tof Sims ◽

Sims Depth Profiling

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A quantitative evaluation of inorganic boundary films formed in engine oils by TOF-SIMS depth profiling with low energy Cs sputtering

Surface and Interface Analysis ◽

10.1002/sia.6596 ◽

2018 ◽

Vol 51 (4) ◽

pp. 413-418

Author(s):

Atsushi Murase ◽

Yuichi Kato ◽

Eiichi Sudo

Keyword(s):

Quantitative Evaluation ◽

Depth Profiling ◽

Low Energy ◽

Engine Oils ◽

Tof Sims ◽

Boundary Films ◽

Sims Depth Profiling

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ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

Journal of the American Society for Mass Spectrometry ◽

10.1007/s13361-019-02224-4 ◽

2019 ◽

Vol 30 (8) ◽

pp. 1537-1544 ◽

Cited By ~ 5

Author(s):

Céline Noël ◽

Yan Busby ◽

Nicolas Mine ◽

Laurent Houssiau

Keyword(s):

Depth Profiling ◽

Depth Resolution ◽

Low Energy ◽

Cesium Ions ◽

Tof Sims ◽

Sims Depth Profiling

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TOF-SIMS depth profiling of SIMON

Applied Surface Science ◽

10.1016/s0169-4332(02)00697-9 ◽

2003 ◽

Vol 203-204 ◽

pp. 441-444

Author(s):

Ge Xin ◽

Gui Dong ◽

Chen Xu ◽

Cha Liangzhen ◽

O. Brox ◽

...

Keyword(s):

Depth Profiling ◽

Tof Sims ◽

Sims Depth Profiling

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ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

Surface and Interface Analysis ◽

10.1002/sia.3426 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 190-193 ◽

Cited By ~ 3

Author(s):

Nimer Wehbe ◽

Laurent Houssiau

Keyword(s):

Vitamin C ◽

Depth Profiling ◽

Ion Beams ◽

Tof Sims ◽

Sims Depth Profiling

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TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-008-2525-7 ◽

2008 ◽

Vol 393 (8) ◽

pp. 1857-1861 ◽

Cited By ~ 7

Author(s):

J. Schnöller ◽

R. Franz ◽

C. Mitterer ◽

H. Hutter

Keyword(s):

Depth Profiling ◽

Hard Coatings ◽

Tof Sims ◽

Sims Depth Profiling ◽

Element Mapping

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Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information

Journal of the American Society for Mass Spectrometry ◽

10.1007/s13361-015-1159-1 ◽

2015 ◽

Vol 26 (8) ◽

pp. 1283-1290 ◽

Cited By ~ 12

Author(s):

Zhaoying Wang ◽

Bingwen Liu ◽

Evan W. Zhao ◽

Ke Jin ◽

Yingge Du ◽

...

Keyword(s):

Depth Profiling ◽

Insulating Materials ◽

Tof Sims ◽

Sims Depth Profiling

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ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

Analytical Chemistry ◽

10.1021/ac300480g ◽

2012 ◽

Vol 84 (11) ◽

pp. 4880-4885 ◽

Cited By ~ 80

Author(s):

Michael A. Robinson ◽

Daniel J. Graham ◽

David G. Castner

Keyword(s):

3D Imaging ◽

Depth Profiling ◽

3T3 Fibroblasts ◽

Tof Sims ◽

Nih 3T3 ◽

Sims Depth Profiling

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ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy

Applied Surface Science ◽

10.1016/j.apsusc.2004.03.141 ◽

2004 ◽

Vol 231-232 ◽

pp. 850-853 ◽

Cited By ~ 9

Author(s):

J. Engkvist ◽

U. Bexell ◽

T.M. Grehk ◽

M. Olsson

Keyword(s):

High Temperature ◽

Depth Profiling ◽

Alumina Scales ◽

High Temperature Alloy ◽

Tof Sims ◽

Sims Depth Profiling

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Low energy dual beam depth profiling: influence of sputter and analysis beam parameters on profile performance using TOF-SIMS

Applied Surface Science ◽

10.1016/s0169-4332(02)00653-0 ◽

2003 ◽

Vol 203-204 ◽

pp. 277-280 ◽

Cited By ~ 31

Author(s):

T. Grehl ◽

R. Möllers ◽

E. Niehuis

Keyword(s):

Depth Profiling ◽

Low Energy ◽

Tof Sims ◽

Dual Beam ◽

Beam Depth ◽

Beam Parameters

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Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique bombardment

Applied Surface Science ◽

10.1016/j.apsusc.2006.05.034 ◽

2006 ◽

Vol 253 (5) ◽

pp. 2662-2670 ◽

Cited By ~ 11

Author(s):

B. Fares ◽

B. Gautier ◽

Ph. Holliger ◽

N. Baboux ◽

G. Prudon ◽

...

Keyword(s):

Erosion Rate ◽

Depth Profiling ◽

Low Energy ◽

Rate Change ◽

Surface Roughening ◽

Sims Depth Profiling

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