ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts
2012 ◽
Vol 84
(11)
◽
pp. 4880-4885
◽
Michael A. Robinson
◽
Daniel J. Graham
◽
David G. Castner
2003 ◽
Vol 203-204
◽
pp. 441-444
Ge Xin
◽
Gui Dong
◽
Chen Xu
◽
Cha Liangzhen
◽
O. Brox
◽
...
2010 ◽
Vol 43
(1-2)
◽
pp. 190-193
◽
Nimer Wehbe
◽
Laurent Houssiau
2008 ◽
Vol 393
(8)
◽
pp. 1857-1861
◽
J. Schnöller
◽
R. Franz
◽
C. Mitterer
◽
H. Hutter
2015 ◽
Vol 26
(8)
◽
pp. 1283-1290
◽
Zhaoying Wang
◽
Bingwen Liu
◽
Evan W. Zhao
◽
Ke Jin
◽
Yingge Du
◽
...
2004 ◽
Vol 231-232
◽
pp. 850-853
◽
J. Engkvist
◽
U. Bexell
◽
T.M. Grehk
◽
M. Olsson
2010 ◽
Vol 30
(1)
◽
pp. 142-174
◽
John S. Fletcher
◽
Nicholas P. Lockyer
◽
John C. Vickerman
2006 ◽
Vol 38
(4)
◽
pp. 833-837
◽
Renáta Oriňáková
◽
Andrej Oriňák
◽
Heinrich F. Arlinghaus
◽
Sebastian Hellweg
◽
Miriam Kupková
◽
...
2018 ◽
Vol 50
(8)
◽
pp. 802-806
◽
Junichiro Sameshima
◽
Masanobu Yoshikawa
2015 ◽
Vol 47
(10)
◽
pp. 953-960
◽
Xianwen Ren
◽
Lu-Tao Weng
◽
Yi Fu
◽
Kai-Mo Ng
◽
Chi-Ming Chan
2018 ◽
Vol 51
(4)
◽
pp. 413-418
Atsushi Murase
◽
Yuichi Kato
◽
Eiichi Sudo