High resolution quantitative SIMS analysis of shallow boron implants in silicon using a bevel and image approach

2005 ◽  
Vol 252 (4) ◽  
pp. 893-904 ◽  
Author(s):  
S. Fearn ◽  
D.S. McPhail
Keyword(s):  
High Resolution ◽  
Sims Analysis ◽  
Quantitative Sims

scholarly journals Quantitative SIMS Analysis of Trace Metallic Impurities in High Purity Copper

1996 ◽  
Vol 60 (3) ◽  
pp. 290-294 ◽  
Author(s):  
Hiroyuki T. Takeshita ◽  
Takuya Kagawa ◽  
Ryosuke O. Suzuki ◽  
Toshio Oishi ◽  
Katsutoshi Ono
Keyword(s):  
High Purity ◽  
Sims Analysis ◽  
Metallic Impurities ◽  
Quantitative Sims ◽  
Purity Copper

Mechanisms of Oxidation of Fuel Cladding Alloys Revealed by High Resolution APT, TEM and SIMS Analysis

2012 ◽  
Vol 1383 ◽  
Author(s):  
Chris R. M. Grovenor ◽  
Na Ni ◽  
Daniel Hudson ◽  
Sean S. Yardley ◽  
Katie L. Moore ◽  
...  
Keyword(s):  
High Resolution ◽  
Metal Oxide ◽  
Oxide Layer ◽  
Electrochemical Impedance ◽  
Complex Structure ◽  
Oxygen Stoichiometry ◽  
Aqueous Environment ◽  
Oxide Interface ◽  
Aqueous Corrosion ◽  
Sims Analysis

ABSTRACTAqueous corrosion of zirconium alloys has become the major factor limiting prolonged fuel campaigns in nuclear plant. Studies using SEM, TEM and electrochemical impedance measurements have been interpreted as showing a dense inner-most oxide layer, and an increased thickness of the layer has been correlated to a better corrosion resistance. Many authors have reported that an ‘intermediate layer’ at the metal oxide interface has a complex structure or/and stochiometry different to that of both the bulk oxide and bulk metal, sometimes claimed to be a suboxide phase. Diffraction evidence has suggested the presence of both cubic ZrO and rhombohedral Zr3O phases, and compositional analysis has revealed similar variations in local oxygen stoichiometry.We have carried out a systematic investigation of the structure and chemistry of the metal/oxide interface in samples of commercial ZIRLO corroded for times up to 180 days. We have developed new experimental techniques for the study of these interfaces both by Electron Energy Loss Spectroscopy (EELS) analysis in the Transmission Electron Microscope (TEM) and by Atom Probe Tomography (APT), and exactly the same samples have been investigated by both techniques. Our results show the development of a clearly defined suboxide layer of stoichiometry close to ZrO, and the subsequent disappearance of this layer at the first of the characteristic ‘breakaway’ transitions in the oxidation kinetics. We can correlate this behaviour with changes in the structure of the oxide layer, and particularly the development of interconnected porosity that links the corroding interface with the aqueous environment. Using high resolution SIMS analysis of isotopically spiked samples we demonstrate the penetration of the oxidising species through these porous outer oxide layers.

High resolution SIMS analysis of arsenic in rice

2012 ◽  
Vol 45 (1) ◽  
pp. 309-311 ◽  
Author(s):  
Katie L. Moore ◽  
Chris R. Hawes ◽  
Steve P. McGrath ◽  
Fang-Jie Zhao ◽  
Chris R. M. Grovenor
Keyword(s):  
High Resolution ◽  
Sims Analysis

Quantitative SIMS analysis of SiC

2003 ◽  
Vol 35 (6) ◽  
pp. 491-495 ◽  
Author(s):  
Yu. Kudriavtsev ◽  
A. Villegas ◽  
A. Godines ◽  
R. Asomoza ◽  
I. Usov
Keyword(s):  
Sims Analysis ◽  
Quantitative Sims

High-resolution SIMS analysis of common lead

1994 ◽  
Vol 112 (1-2) ◽  
pp. 57-70 ◽  
Author(s):  
N.S. Belshaw ◽  
R.K. O'Nions ◽  
D.J. Martel ◽  
K.W. Burton
Keyword(s):  
High Resolution ◽  
Common Lead ◽  
Sims Analysis

Quantitative SIMS analysis of nitrogen using in situ internal implantation

1999 ◽  
Vol 147 (1-4) ◽  
pp. 14-18 ◽  
Author(s):  
S Seki ◽  
H Tamura ◽  
H Sumiya
Keyword(s):  
Sims Analysis ◽  
Quantitative Sims
Sign in / Sign up

Export Citation Format

Share Document