Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach

2004 ◽  
Vol 231-232 ◽  
pp. 821-825 ◽  
Author(s):  
S.G. Alberici ◽  
R. Zonca ◽  
B. Pashmakov
Keyword(s):  
Depth Profile ◽  
Tof Sims ◽  
Sims Depth Profile

Analyzing 3D hyperspectral TOF-SIMS depth profile data using self-organizing map-relational perspective mapping

2020 ◽  
Vol 15 (6) ◽  
pp. 061004
Author(s):  
Wil Gardner ◽  
David A. Winkler ◽  
Davide Ballabio ◽  
Benjamin W. Muir ◽  
Paul J. Pigram
Keyword(s):  
Depth Profile ◽  
Self Organizing Map ◽  
Profile Data ◽  
Relational Perspective ◽  
Tof Sims ◽  
Sims Depth Profile ◽  
Self Organizing

ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride

2009 ◽  
Vol 51 (9) ◽  
pp. 1883-1886 ◽  
Author(s):  
Antoine Seyeux ◽  
Ming Liu ◽  
Patrik Schmutz ◽  
Guangling Song ◽  
Andrej Atrens ◽  
...  
Keyword(s):  
Depth Profile ◽  
Surface Film ◽  
Pure Water ◽  
Magnesium Hydride ◽  
Pure Magnesium ◽  
Tof Sims ◽  
Sims Depth Profile

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering

The Analyst ◽  
2016 ◽  
Vol 141 (8) ◽  
pp. 2523-2533 ◽  
Author(s):  
Yi-Hsuan Chu ◽  
Hua-Yang Liao ◽  
Kang-Yi Lin ◽  
Hsun-Yun Chang ◽  
Wei-Lun Kao ◽  
...  
Keyword(s):  
Steady State ◽  
Depth Profile ◽  
Mass Spectroscopy ◽  
Ion Beam ◽  
Depth Profiles ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion ◽  
Sims Depth Profile

The Ar2500+ and O2+ cosputter in ToF-SIMS depth profiles retained >95% molecular ion intensity in the steady-state.

SIMS depth profile characterisation of InAlN/GaN structures

2010 ◽  
Author(s):  
A. Vincze ◽  
J. Kovac ◽  
H. Behmenburg ◽  
R. Srnanek ◽  
F. Uherek ◽  
...  
Keyword(s):  
Depth Profile ◽  
Sims Depth Profile
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