Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry

2004 ◽  
Vol 231-232 ◽  
pp. 328-331 ◽  
Author(s):  
Z. Li ◽  
R.D. Rickman ◽  
S.V. Verkhoturov ◽  
E.A. Schweikert
Nanoscale ◽  
2017 ◽  
Vol 9 (44) ◽  
pp. 17571-17575 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Gutowski ◽  
Dorota Pierścińska ◽  
Kamil Pierściński ◽  
Maciej Bugajski ◽  
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Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.


2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  

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