Evaluation of enamel surface roughness after orthodontic bracket debonding with atomic force microscopy

2017 ◽  
Vol 151 (3) ◽  
pp. 521-527 ◽  
Author(s):  
Shadi Mohebi ◽  
Hassan-Ali Shafiee ◽  
Nazila Ameli
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Enamel Surface ◽  
Orthodontic Bracket ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Comparison of the Enamel Surface Roughness from Different Polishing Methods: Scanning Electron Microscopy and Atomic Force Microscopy Investigation

2020 ◽  
Vol 14 (02) ◽  
pp. 299-305
Author(s):  
Kiatanan Sugsompian ◽  
Ratchawan Tansalarak ◽  
Thosapol Piyapattamin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Enamel Surface ◽  
Similar Data ◽  
Force Microscopy ◽  
Atomic Force ◽  
Significant Difference ◽  
Scanning Electron

Abstract Objective This study aimed to compare the enamel surface roughness created by four polishing methods after debonding, by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Materials and Methods Four experimental polishing groups (Sof-Lex disc, SD; sandblaster, SB; tungsten carbide bur, TB; and white stone bur, WB) and one control group were selected from 100 premolars (n = 20/group). The experimental teeth were bonded with a bracket, thermocycled, and debonded. Residual adhesive was removed by either of the respective methods. Pre and postdebonding root mean square (Rq) values were obtained from AFM evaluations. All specimens were examined and evaluated with SEM using a modified enamel surface index (modified ESI). Statistical Analysis Differences among the polishing methods were compared with analysis of variance and Fisher’s least significant difference test at p < 0.05. Results Both microscopic evaluations indicated that the surface with the greatest roughness herein belonged to the SD group, followed by that for SB, TB, and WB groups. AFM measurements indicated a maximum postdebonding Rq herein for the WB group and a significantly greater surface roughness for the TB and WB groups than for the SD and SB groups. Among the experimental groups, SEM followed by modified ESI evaluations revealed similar data to those obtained with AFM. Significant differences were seen among all paired groups, except for that between the SB and TB groups. Conclusion Within the limitations of this study, all four polishing methods were concluded to be clinically acceptable for removing residual orthodontic adhesives.

scholarly journals Comparative effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding and composite resin removal: An atomic force microscopy

2019 ◽  
Vol 9 ◽  
pp. 223-229
Author(s):  
Faeze Qabel ◽  
Riehane Talaei ◽  
Saeedeh Saeedi ◽  
Raheb Ghorbani ◽  
Nazila Ameli
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Composite Resin ◽  
Cost Effective ◽  
Orthodontic Bracket ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Level Of Significance ◽  
One Way Anova

Purpose: Porcelain polishing after orthodontic bracket debonding and resin removal is imperative to eliminate surface roughness and minimize the risk of plaque accumulation, periodontal disease, and porcelain discoloration. This study aimed to assess the effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding. Materials and Methods: Thirty porcelain blocks were divided into three groups. Surface roughness of the samples was first measured using atomic force microscopy (AFM) and recorded as baseline. Orthodontic brackets were bonded to blocks by composite resin. After bracket debonding, resin remnants were removed by tungsten carbide bur. The blocks were then polished with Sof-Lex discs, Meisinger, and Jota porcelain polishing kit. Surface roughness was measured again using AFM. The Shapiro–Wilk test, one-way ANOVA, and Tukey’s post hoc test were used for data analysis through SPSS version 18.0. Level of significance was set at 5%. Results: The mean change in surface roughness after polishing with Jota kit (56.6 nm) was significantly greater than that compared to Sof-Lex discs (10.7 nm) (P = 0.003) and Meisinger kit (26.6 nm) (P = 0.024). The mean change in surface roughness was not significantly different between Sof-Lex and Meisinger groups. Surface roughness significantly increased in all three groups (P < 0.05). Conclusion: Meisinger polishing kit and Sof-Lex discs were not significantly different in terms of the resultant surface roughness. Thus, the conventional use of Sof-Lex discs seems to be more cost-effective due to their lower cost.

Prenatally administered HMB modifies the enamel surface roughness in spiny mice offspring: An atomic force microscopy study

2016 ◽  
Vol 70 ◽  
pp. 24-31 ◽  
Author(s):  
Izabela Świetlicka ◽  
Siemowit Muszyński ◽  
Ewa Tomaszewska ◽  
Piotr Dobrowolski ◽  
Anita Kwaśniewska ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Enamel Surface ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spiny Mice

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

1996 ◽  
Vol 428 ◽  
Author(s):  
G. O. Ramseyer ◽  
L. H. Walsh ◽  
J. V. Beasock ◽  
H. F. Helbig ◽  
R. C. Lacoe ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Copper Diffusion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Widths ◽  
Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

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