Radiometric characterisation of light sources used in analytical chemistry – A review

Microdroplet Actuation via Light Line Optoelectrowetting (LL-OEW)

International Journal of Analytical Chemistry ◽

10.1155/2021/3402411 ◽

2021 ◽

Vol 2021 ◽

pp. 1-9

Author(s):

Christoph Doering ◽

Johannes Strassner ◽

Henning Fouckhardt

Keyword(s):

Analytical Chemistry ◽

Digital Microfluidics ◽

Light Sources ◽

Chip Surface ◽

Chip Design ◽

Optical Components ◽

Electrowetting On Dielectric ◽

Layer Sequence ◽

Light Line ◽

Light Beams

Meanwhile, electrowetting-on-dielectric (EWOD) is a well-known phenomenon, even often exploited in active micro-optics to change the curvature of microdroplet lenses or in analytical chemistry with digital microfluidics (DMF, lab on a chip 2.0) to move/actuate microdroplets. Optoelectrowetting (OEW) can bring more flexibility to DMF because in OEW, the operating point of the lab chip is locally controlled by a beam of light, usually impinging onto the chip perpendicularly. As opposed to pure EWOD, for OEW, none of the electrodes has to be structured, which makes the chip design and production technology simpler; the path of any actuated droplet is determined by the movement of the light spot. However, for applications in analytical chemistry, it would be helpful if the space both below as well as that above the lab chip were not obstructed by any optical components and light sources. Here, we report on the possibility to actuate droplets by laser light beams, which traverse the setup parallel to the chip surface and inside the OEW layer sequence. Since microdroplets are grabbed by this surface-parallel, nondiverging, and nonexpanded light beam, we call this principle “light line OEW” (LL-OEW).

Download Full-text

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013554x ◽

1990 ◽

Vol 48 (2) ◽

pp. 388-389

Author(s):

A. M. Bradshaw

Keyword(s):

Photoelectron Spectroscopy ◽

Chemical Reactivity ◽

Target Material ◽

Orbital Energy ◽

Light Sources ◽

Analytical Technique ◽

Hartree Fock ◽

Spatially Resolved ◽

Koopmans Theorem ◽

Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Download Full-text

Tandem scanning confocal light microscopy as compared with x-ray diffraction for characterizing the behavior of clays in fluid-saturated petroleum reservoir rock

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152719 ◽

1989 ◽

Vol 47 ◽

pp. 148-149

Author(s):

C.J. Stuart ◽

B.E. Viani ◽

J. Walker ◽

T.H. Levesque

Keyword(s):

Light Microscopy ◽

Image Plane ◽

Reservoir Rock ◽

Depth Of Field ◽

Objective Lens ◽

Scanning System ◽

Light Sources ◽

Petroleum Reservoir ◽

Image Recording ◽

Scan Speed

Many techniques of imaging used to characterize petroleum reservoir rocks are applied to dehydrated specimens. In order to directly study behavior of fines in reservoir rock at conditions similar to those found in-situ these materials need to be characterized in a fluid saturated state.Standard light microscopy can be used on wet specimens but depth of field and focus cannot be obtained; by using the Tandem Scanning Confocal Microscope (TSM) images can be produced from thin focused layers with high contrast and resolution. Optical sectioning and extended focus images are then produced with the microscope. The TSM uses reflected light, bulk specimens, and wet samples as opposed to thin section analysis used in standard light microscopy. The TSM also has additional advantages: the high scan speed, the ability to use a variety of light sources to produce real color images, and the simple, small size scanning system. The TSM has frame rates in excess of normal TV rates with many more lines of resolution. This is accomplished by incorporating a method of parallel image scanning and detection. The parallel scanning in the TSM is accomplished by means of multiple apertures in a disk which is positioned in the intermediate image plane of the objective lens. Thousands of apertures are distributed in an annulus, so that as the disk is spun, the specimen is illuminated simultaneously by a large number of scanning beams with uniform illumination. The high frame speeds greatly simplify the task of image recording since any of the normally used devices such as photographic cameras, normal or low light TV cameras, VCR or optical disks can be used without modification. Any frame store device compatible with a standard TV camera may be used to digitize TSM images.

Download Full-text