Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering

Analytica Chimica Acta ◽

10.1016/j.aca.2014.08.044 ◽

2014 ◽

Vol 852 ◽

pp. 129-136 ◽

Cited By ~ 7

Author(s):

Hua-Yang Liao ◽

Meng-Hung Tsai ◽

Wei-Lun Kao ◽

Ding-Yuan Kuo ◽

Jing-Jong Shyue

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Beam Parameters ◽

Secondary Ion

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

Journal of Analytical Atomic Spectrometry ◽

10.1039/d0ja00289e ◽

2021 ◽

Author(s):

Lluís Yedra ◽

C. N. Shyam Kumar ◽

Alisa Pshenova ◽

Esther Lentzen ◽

Patrick Philipp ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Energy Dispersive ◽

New Method ◽

X Ray ◽

Edx Analysis ◽

Ion Mass Spectrometry ◽

Trace Concentrations ◽

Secondary Ion

The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

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Characterization and removal of ion yield transients in the near surface region of secondary ion mass spectrometry depth profiles

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574825 ◽

1987 ◽

Vol 5 (1) ◽

pp. 9-14 ◽

Cited By ~ 27

Author(s):

S. R. Bryan ◽

R. W. Linton ◽

D. P. Griffis

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Surface Region ◽

Near Surface ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Aluminas modified with silica. Part 1.—An X-ray diffraction and secondary-ion mass-spectrometry study of the influence of preparation and thermal treatment on structure and surface composition

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19848001903 ◽

1984 ◽

Vol 80 (7) ◽

pp. 1903 ◽

Cited By ~ 9

Author(s):

Alan W. Espie ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Thermal Treatment ◽

Secondary Ion Mass Spectrometry ◽

Surface Composition ◽

X Ray Diffraction ◽

X Ray ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac101746h ◽

2010 ◽

Vol 82 (19) ◽

pp. 8291-8299 ◽

Cited By ~ 32

Author(s):

Alan M. Piwowar ◽

John S. Fletcher ◽

Jeanette Kordys ◽

Nicholas P. Lockyer ◽

Nicholas Winograd ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Sample Analysis ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Cited By ~ 14

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

Secondary Ion

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Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

Journal of Cereal Science ◽

10.1016/j.jcs.2013.12.006 ◽

2014 ◽

Vol 59 (2) ◽

pp. 173-180 ◽

Cited By ~ 50

Author(s):

Bianca Kyriacou ◽

Katie L. Moore ◽

David Paterson ◽

Martin D. de Jonge ◽

Daryl L. Howard ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Fluorescence Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Rice Grain ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578851 ◽

1994 ◽

Vol 12 (3) ◽

pp. 671-676 ◽

Cited By ~ 4

Author(s):

P. W. Jahn ◽

F. M. Petrat ◽

D. Wolany ◽

M. Deimel ◽

T. Gantenfort ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

On Line ◽

Secondary Ion

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Ultrashallow Boron Junctions in Silicon Characterization by Secondary Ion Mass Spectrometry and Synchrotron Radiation Grazing Incidence X-Ray Fluorescence Techniques

ECS Meeting Abstracts ◽

10.1149/ma2009-02/22/2008 ◽

2009 ◽

Keyword(s):

Mass Spectrometry ◽

Synchrotron Radiation ◽

Secondary Ion Mass Spectrometry ◽

Grazing Incidence ◽

X Ray ◽

Fluorescence Techniques ◽

Ion Mass Spectrometry ◽

Secondary Ion

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