Recent advances in ZnO nanostructures and thin films for biosensor applications: Review

2012 ◽  
Vol 737 ◽  
pp. 1-21 ◽  
Author(s):  
Sunil K. Arya ◽  
Shibu Saha ◽  
Jaime E. Ramirez-Vick ◽  
Vinay Gupta ◽  
Shekhar Bhansali ◽  
...  
2004 ◽  
Vol 450 (1) ◽  
pp. 23-28 ◽  
Author(s):  
S. Banerjee ◽  
S. Ferrari ◽  
D. Chateigner ◽  
A. Gibaud
Keyword(s):  
X Ray ◽  

2018 ◽  
Vol 80 ◽  
pp. 143-161 ◽  
Author(s):  
P. Vishnukumar ◽  
S. Vivekanandhan ◽  
M. Misra ◽  
A.K. Mohanty

1993 ◽  
Vol 308 ◽  
Author(s):  
Shefford P. Baker ◽  
T.P. Weihs

In light of recent advances in the analysis of depth-sensing indentation data and of the importance of this technique in the study of the mechanical properties of thin films, a special discussion session was held in order to explore the state of the art and to provide an informal forum for discussion. This is a brief review of that discussion. The discussion was focused by the four main sources of deviation from model behavior described in the previous paper.


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