Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire

2006 ◽  
Vol 253 (1) ◽  
pp. 95-105 ◽  
Author(s):  
A. Boulle ◽  
R. Guinebretière ◽  
O. Masson ◽  
R. Bachelet ◽  
F. Conchon ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Oxide Thin Films ◽  
X Ray ◽  
Recent Advances ◽  
Nanostructured Oxide

Textured Pb(Zr0.54Ti0.46)O3 Thin Films with YBa2Cu3O7-δ and Yttria-Stabilized Zirconia Buffer Layers on (001)Si

1993 ◽  
Vol 310 ◽  
Author(s):  
Tsvetanka Zheleva ◽  
P. Tiwari ◽  
J. Narayan
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Yttria Stabilized Zirconia ◽  
Buffer Layers ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
Stabilized Zirconia ◽  
X Ray

AbstractCharacteristics of textured Pb(Zr0.54Ti0.46)O3 (PZT) thin films on (001)Si with YBa2Cu3O7-δ (YBCO) and yttria-stabilized zirconia (YSZ) buffer layers have been studied using X-ray diffraction and high resolution electron microscopy techniques. Excimer KrF laser has been used for deposition of PZT, YBCO and YSZ thin films. The YBCO layer was utilized to provide a seed for PZT growth, while YSZ layer acted as a seed and a buffer layer for the growth of YBCO on (001)Si. High-resolution transmission electron microscopy (HRTEM) and X-ray diffraction were used to determine the texture and the nature of defects, interfaces and grain boundaries. Predominant orientation relationships were found to be [001]PZT//[001]YBCO; [001]YBCO//[001]YSZ; and [001]YSZ//[001]Si.

scholarly journals High-resolution X-ray diffraction analysis of strain relaxation in epitaxial oxide thin films

2008 ◽  
Vol 64 (a1) ◽  
pp. C106-C106
Author(s):  
R. Guinebretiere ◽  
F. Conchon ◽  
A. Boulle ◽  
C. Girardot ◽  
S. Pignard ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Diffraction Analysis ◽  
Strain Relaxation ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Epitaxial Oxide

Growth of biepitaxial zinc oxide thin films on silicon (100) using yttria-stabilized zirconia buffer layer

2008 ◽  
Vol 93 (25) ◽  
pp. 251905 ◽  
Author(s):  
Ravi Aggarwal ◽  
Chunming Jin ◽  
Punam Pant ◽  
J. Narayan ◽  
Roger J. Narayan
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Buffer Layer ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Oxide Thin Films

Characterization of single crystal uranium-oxide thin films grown via reactive-gas magnetron sputtering on yttria-stabilized zirconia and sapphire

2012 ◽  
Vol 520 (17) ◽  
pp. 5616-5626 ◽  
Author(s):  
Melissa M. Strehle ◽  
Brent J. Heuser ◽  
Mohamed S. Elbakhshwan ◽  
Xiaochun Han ◽  
David J. Gennardo ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Single Crystal ◽  
Uranium Oxide ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Oxide Thin Films ◽  
Reactive Gas

High-resolution soft x-ray spectroscopic study on amorphous gallium indium zinc oxide thin films

2010 ◽  
Vol 108 (2) ◽  
pp. 024507 ◽  
Author(s):  
Mi Ji Lee ◽  
Se Jun Kang ◽  
Jae Yoon Baik ◽  
Ki-jeong Kim ◽  
Hyeong-Do Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
High Resolution ◽  
Spectroscopic Study ◽  
Oxide Thin Films ◽  
X Ray ◽  
Indium Zinc Oxide
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