1999 ◽  
Vol 77 (5) ◽  
pp. 371-384 ◽  
Author(s):  
E Abou-Allam ◽  
T Manku ◽  
C -H Chen ◽  
M J Deen

This paper describes a self-consistent lumped linear network model for MOSFETs that takes into account the distributed nature of the gate resistance. The model is verified with experimental results. The self-consistent model consists of placing a lumped resistance in series with the gate. The lumped resistance takes the value of the total gate resistance divided by a factor of three. To second order in jω, this is shown to be almost an exact approximation in determining all y-parameters and the equivalent noise resistance. The third-order terms, however, give rise to a 17% error. The value of ft for a MOS transistor shows no dependence with the gate resistance to all orders in jω. Furthermore, we also show that the thermal noise arising from the distributed gate resistance does not contribute to any additional equivalent input current noise. PACS No.: 73.40


2021 ◽  
Author(s):  
Dmitry Alexandrovich Zatuchny ◽  
Ruslan Nikolaevich Akinshin ◽  
Nina Ivanovna Romancheva ◽  
Igor Viktorovich Avtin ◽  
Yury Grigorievich Shatrakov

2014 ◽  
Vol 574 ◽  
pp. 718-722
Author(s):  
Ning Ji ◽  
Jun Tan ◽  
An Shan Pei ◽  
Jia Fei Dai ◽  
Jun Wang

This paper presents the Multiscale Mutual Mode Entropy algorithm to quantify the coupling degree between two alpha rhythm EEG time series which are simultaneously acquired. The results show that in the process of scale change, the young and middle-aged differ from each other in terms of the coupling degree of alpha rhythm EEG and the difference grow clear gradually. So the Multiscale Mutual Mode Entropy can be used to analyze the coupling information of time series under different physiological status, and it also has good noise resistance. Besides, as an indicator of measuring brain function, in the future it can also come to the aid of clinical evaluation of brain function.


CORROSION ◽  
2000 ◽  
Vol 56 (9) ◽  
pp. 928-934
Author(s):  
G. Miramontes de León ◽  
D. C. Farden ◽  
D. E. Tallman

Abstract A new approach for the measurement of noise resistance based on the transient behavior of pitting corrosion is presented. Potential noise and current transients have been recognized as a characteristic behavior of pitting corrosion. This new approach uses the transient information present during corrosion as a way to estimate the noise resistance of coated metals directly. Computer simulation and analytical results are presented, indicating that the new technique can be applied to the problem of noise resistance estimation. This new approach was applied to experimental electrochemical noise data obtained with commercial electrochemical impedance spectroscopy (EIS)/electrochemcial noise measurement (ENM) equipment.


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