Characterization of Nanocomposite Coatings in the System Ti-B-N by Analytical Electron Microscopy and X-Ray Photoelectron Spectroscopy

2002 ◽  
Vol 133 (6) ◽  
pp. 837-848 ◽  
Author(s):  
Andreas Gupper ◽  
Asunción Fernández ◽  
Christina Fernández-Ramos ◽  
Ferdinand Hofer ◽  
Christian Mitterer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Analytical Electron Microscopy ◽  
Nanocomposite Coatings ◽  
X Ray ◽  
Analytical Electron

Characterization of Nanocomposite Coatings in the System Ti-B-N by Analytical Electron Microscopy and X-Ray Photoelectron Spectroscopy

2002 ◽  
pp. 101-112 ◽  
Author(s):  
Andreas Gupper ◽  
Asunción Fernández ◽  
Christina Fernández-Ramos ◽  
Ferdinand Hofer ◽  
Christian Mitterer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Analytical Electron Microscopy ◽  
Nanocomposite Coatings ◽  
X Ray ◽  
Analytical Electron

Characterization of Si(Li) x-ray detector efficiencies in the low energy range

1986 ◽  
Vol 44 ◽  
pp. 710-711
Author(s):  
G. Wirmark ◽  
G. Wahlberg ◽  
H. Nordén
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Energy Range ◽  
Analytical Electron Microscopy ◽  
Low Energy ◽  
Ratio Method ◽  
X Ray ◽  
Standard Specimens ◽  
Analytical Electron

X-ray microanalysis with windowless or ultra-thin window Si(Li)-detectors is becoming increasingly important in analytical electron microscopy. The most common approach in the quantification of this method is the thin film ratio method.where CA and CB denote the concentrations of elements A and B respectively and IA and IB are the corresponding x-ray intensities. The KAB-factor should ideally be determined from analyses of standard specimens of known compositions.

scholarly journals Correlative 3D-Characterization of Liquid Metal Catalysts (LMC) utilizing X-ray and Analytical Electron Microscopy

2018 ◽  
Vol 24 (S2) ◽  
pp. 556-557 ◽  
Author(s):  
Janis Wirth ◽  
Silvan Englisch ◽  
Christian Wiktor ◽  
Nicola Taccardi ◽  
Peter Wasserscheid ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Liquid Metal ◽  
Analytical Electron Microscopy ◽  
Metal Catalysts ◽  
X Ray ◽  
Analytical Electron

Analytical Electron Microscopy of Solid Catalysts

1982 ◽  
Vol 40 ◽  
pp. 660-663
Author(s):  
F. Delannay
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Supported Metal Catalysts ◽  
X Ray ◽  
Solid Catalysts ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Conventional Transmission Electron Microscope ◽  
Electron Microdiffraction

Practical catalysts are usually intricate mixtures of phases which cannot be characterized separately unless looked at below the micron scale. For about two decades, electron microscopy has been a priviledged complement to selective chemisorption methods for the study of supported metal catalysts. Until recently, however, reliable tools allowing characterization of oxide and sulfide catalysts (e.g. for selective oxidation and hydrodesulfurization reactions) have been lacking. This contribution aims at illustrating the new insights into the understanding of these systems which have been provided by the combination of thin film X-ray microanalysis and electron microdiffraction within a conventional transmission electron microscope with STEM and EDS attachments.

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