Operative Record Using Intraoperative Digital Data in Neurosurgery Technical Note

2000 ◽  
Vol 142 (8) ◽  
pp. 913-919 ◽  
Author(s):  
K. Houkin ◽  
S. Kuroda ◽  
H. Abe
Keyword(s):  
Technical Note ◽  
Digital Data ◽  
Operative Record

scholarly journals Digital Denture Fabrication: A Technical Note

2021 ◽  
Vol 11 (17) ◽  
pp. 8093
Author(s):  
Shavkat Dusmukhamedov ◽  
Chu-Nui Lee ◽  
Seung-Mi Jeong ◽  
Byung-Ho Choi
Keyword(s):  
Technical Note ◽  
Digital Data ◽  
Complete Dentures ◽  
Intraoral Scanner ◽  
Denture Base ◽  
Digital Impressions ◽  
Fabrication Procedure ◽  
Conventional Manner ◽  
Digital Denture ◽  
Edentulous Jaws

Fabricating a complete denture in a conventional manner may be complicated and difficult. The purpose of this article was to describe the benefits of a fully digital workflow and fabrication procedure of complete dentures based on digital impressions of edentulous jaws. The digital data for the workflow were acquired using an intraoral scanner and were then used to design the denture base and teeth. The resulting data were exported to a 3D printer or a milling machine for denture fabrication.

Practical applications of scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 18-19
Author(s):  
D. R. Denley
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Quantitative Information ◽  
Digital Data ◽  
Scanning Tunneling ◽  
Ambient Atmosphere ◽  
Tunneling Microscopy ◽  
Clear Trend ◽  
Practical Applications ◽  
Promising Tool

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

Convergent-beam thickness determination: The advantages of digital imaging

1994 ◽  
Vol 52 ◽  
pp. 420-421
Author(s):  
Stuart McKernan ◽  
C. Barry Carter
Keyword(s):  
Intensity Variation ◽  
Convergent Beam Electron Diffraction ◽  
Digital Data ◽  
Thickness Determination ◽  
Frequent Use ◽  
Automated Processing ◽  
Beam Thickness ◽  
Convergent Beam ◽  
Remarkable Agreement

Convergent-beam electron diffraction (CBED) patterns contain an immense amount of information relating to the structure of the material from which they are obtained. The analysis of these patterns has progressed to the point that under appropriate, well specified conditions, the intensity variation within the CBED discs may be understood in a quantitative sense. Rossouw et al for example, have produced numerical simulations of zone-axis CBED patterns which show remarkable agreement with experimental patterns. Spence and co-workers have obtained the structure factor parameters for lowindex reflections using the intensity variation in 2-beam CBED patterns. Both of these examples involve the use of digital data. Perhaps the most frequent use for quantitative CBED analysis is the thickness determination described by Kelly et al. This analysis has been implemented in a variety of different ways; from real-time, in-situ analysis using the microscope controls, to measurements of photographic prints with a ruler, to automated processing of digitally acquired images. The potential advantages of this latter process will be presented.

Slow-scan CCD cameras and low-dose High-Resolution Electron Microscopy: Direct and quantitative

1994 ◽  
Vol 52 ◽  
pp. 412-413
Author(s):  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Structural Damage ◽  
Low Dose ◽  
Dynamic Range ◽  
High Resolution Electron Microscopy ◽  
Operating Conditions ◽  
Digital Data ◽  
Ccd Cameras ◽  
Resolution Electron

It has been known for many years that materials such as zeolites, polymers, and biological specimens have crystalline structures that are vulnerable to electron beam irradiation. This radiation damage severely restrains the use of high resolution electron microscopy (HREM). As a result, structural characterization of these materials using HREM techniques becomes difficult and challenging. The emergence of slow-scan CCD cameras in recent years has made it possible to record high resolution (∽2Å) structural images with low beam intensity before any apparent structural damage occurs. Among the many ideal properties of slow-scan CCD cameras, the low readout noise and digital recording allow for low-dose HREM to be carried out in an efficient and quantitative way. For example, the image quality (or resolution) can be readily evaluated on-line at the microscope and this information can then be used to optimize the operating conditions, thus ensuring that high quality images are recorded. Since slow-scan CCD cameras output (undistorted) digital data within the large dynamic range (103-104), they are ideal for quantitative electron diffraction and microscopy.

Quantitative Electron Microscope with imaging plate

1994 ◽  
Vol 52 ◽  
pp. 408-409
Author(s):  
D. Shindo
Keyword(s):  
Electron Microscope ◽  
Dynamic Range ◽  
Processing System ◽  
Digital Data ◽  
Imaging Plate ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
Resolution Electron ◽  
Electron Intensity ◽  
Diffraction Patterns

Imaging plate has good properties, i.e., a wide dynamic range and good linearity for the electron intensity. Thus the digital data (2048x1536 pixels, 4096 gray levels in log scale) obtained with the imaging plate can be used for quantification in electron microscopy. By using the image processing system (PIXsysTEM) combined with a main frame (ACOS3900), quantitative analysis of electron diffraction patterns and high-resolution electron microscope (HREM) images has been successfully carried out.In the analysis of HREM images observed with the imaging plate, quantitative comparison between observed intensity and calculated intensity can be carried out by taking into account the experimental parameters such as crystal thickness and defocus value. An example of HREM images of quenched Tl2Ba2Cu1Oy (Tc = 70K) observed with the imaging plate is shown in Figs. 1(b) - (d) comparing with a structure model proposed by x-ray diffraction study of Fig. 1 (a). The image was observed with a JEM-4000EX electron microscope (Cs =1.0 mm).

New AAC Access Strategy for Gesture Tracking: A Technical Note

2012 ◽  
Vol 21 (1) ◽  
pp. 11-16 ◽  
Author(s):  
Susan Fager ◽  
Tom Jakobs ◽  
David Beukelman ◽  
Tricia Ternus ◽  
Haylee Schley
Keyword(s):  
Augmentative And Alternative Communication ◽  
Technical Note ◽  
Head Tracking ◽  
Alternative Communication ◽  
Access Methods ◽  
Cord Injury ◽  
Physical Limitations ◽  
Gesture Tracking ◽  
Communication Needs ◽  
Tracking Device

Abstract This article summarizes the design and evaluation of a new augmentative and alternative communication (AAC) interface strategy for people with complex communication needs and severe physical limitations. This strategy combines typing, gesture recognition, and word prediction to input text into AAC software using touchscreen or head movement tracking access methods. Eight individuals with movement limitations due to spinal cord injury, amyotrophic lateral sclerosis, polio, and Guillain Barre syndrome participated in the evaluation of the prototype technology using a head-tracking device. Fourteen typical individuals participated in the evaluation of the prototype using a touchscreen.

Technical Note

1998 ◽  
Vol 47 (3) ◽  
pp. 153-160
Author(s):  
Wang ◽  
Park ◽  
Kang ◽  
Oh
Keyword(s):  
Technical Note
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