Optical characterization of thin thermal oxide films on copper by ellipsometry

2002 ◽  
Vol 75 (3) ◽  
pp. 391-395 ◽  
Author(s):  
H. Derin ◽  
K. Kantarli
2011 ◽  
Vol 519 (17) ◽  
pp. 5767-5770 ◽  
Author(s):  
A. Karpinski ◽  
N. Ouldhamadouche ◽  
A. Ferrec ◽  
L. Cattin ◽  
M. Richard-Plouet ◽  
...  

2008 ◽  
Vol 516 (14) ◽  
pp. 4563-4567 ◽  
Author(s):  
Hiroshi Kakiuchida ◽  
Ping Jin ◽  
Masato Tazawa

1999 ◽  
Author(s):  
Francesca Varsano ◽  
A. V. Krasilnikova ◽  
Franco Decker ◽  
Enrico Masetti

2009 ◽  
Vol 7 ◽  
pp. 486-490 ◽  
Author(s):  
David Necas ◽  
Lenka Zajícková ◽  
Daniel Franta ◽  
Pavel St'ahel ◽  
Petr Mikulík ◽  
...  

2009 ◽  
Vol 9 (9) ◽  
pp. 5254-5261 ◽  
Author(s):  
I. Navas ◽  
R. Vinodkumar ◽  
K. J. Lethy ◽  
M. Satyanarayana ◽  
V. Ganesan ◽  
...  

2004 ◽  
Vol 455-456 ◽  
pp. 201-206 ◽  
Author(s):  
Andreas Pflug ◽  
Volker Sittinger ◽  
Florian Ruske ◽  
Bernd Szyszka ◽  
Georg Dittmar

2007 ◽  
Vol 46 (2) ◽  
pp. 621-626 ◽  
Author(s):  
Hiroshi Kakiuchida ◽  
Ping Jin ◽  
Masahisa Okada ◽  
Masato Tazawa

Sign in / Sign up

Export Citation Format

Share Document