Direct observations of vortices in a high-Tc superconductor (La1-xSrx)2CuO4 by scanning SQUID microscopy

2001 ◽  
Vol 72 (S2) ◽  
pp. S263-S266 ◽  
Author(s):  
J. Kasai ◽  
N. Okazaki ◽  
Y. Togawa ◽  
T. Sasagawa ◽  
J. Shimoyama ◽  
...  
Author(s):  
Rajen Dias ◽  
Lars Skoglund ◽  
Zhiyong Wang ◽  
David Smith

Abstract Scanning superconducting quantum interference device (SQUID) microscopy using high-TC SQUID sensor has been slowly gaining acceptance in the failure analysis (FA) community as a number of silicon device manufacturers are applying the tool and technique to an ever-broadening spectrum of silicon technologies for detecting the location of leakage and short failures by imaging the current path through the die and package. This paper will present the application of scanning SQUID microscopy to short isolation on die and explore the integration of this technique into the FA flow. From the examples presented in this paper, it can be seen that die level short isolation has been possible even when the separation from SQUID sensor to current is about 800-900µm. Several potentially useful techniques that will increase the accuracy of locating the die level short nondestructively are also discussed.


2003 ◽  
Vol 388-389 ◽  
pp. 267-268
Author(s):  
Junpei Kasai ◽  
Noriaki Okazaki ◽  
Yuri Nakayama ◽  
Teruki Motohashi ◽  
Jun-ichi Shimoyama ◽  
...  

2002 ◽  
Vol 367 (1-4) ◽  
pp. 9-14 ◽  
Author(s):  
I Iguchi ◽  
A Sugimoto ◽  
T Yamaguchi ◽  
N Chaki ◽  
T Miyake ◽  
...  

2001 ◽  
Vol 14 (12) ◽  
pp. 1124-1127 ◽  
Author(s):  
X Zhao ◽  
J Kasai ◽  
N Okazaki ◽  
Y Nakayama ◽  
Y Togawa ◽  
...  

Author(s):  
H.-J. Ou ◽  
J. M. Cowley

Using the dedicate VG-HB5 STEM microscope, the crystal structure of high Tc superconductor of YBa2Cu3O7-x has been studied via high resolution STEM (HRSTEM) imaging and nanobeam (∽3A) diffraction patterns. Figure 1(a) and 2(a) illustrate the HRSTEM image taken at 10' times magnification along [001] direction and [100] direction, respectively. In figure 1(a), a grain boundary with strong field contrast is seen between two crystal regions A and B. The grain boundary appears to be parallel to a (110) plane, although it is not possible to determine [100] and [001] axes as it is in other regions which contain twin planes [3]. Following the horizontal lattice lines, from left to right across the grain boundary, a lattice bending of ∽4° is noticed. Three extra lattice planes, indicated by arrows, were found to terminate at the grain boundary and form dislocations. It is believed that due to different chemical composition, such structure defects occur during crystal growth. No bending is observed along the vertical lattice lines.


Author(s):  
R. B. Marinenko

Internally oxidized Ag-Mg alloys are used as sheaths for high Tc superconductor wires because of their superior mechanical properties. The preparation and characteristics of these materials have been reported. Performance of the sheaths depends on the concentration of the magnesium which generally is less than 0.5 wt. percent. The purpose of this work was to determine whether electron probe microanalysis using energy dispersive spectrometry (EDS) could be used to quantitate three different Ag-Mg alloys. Quantitative EDS analysis can be difficult because the AgL escape peak occurs at the same energy (1.25 keV) as the Mg Kα peak. An EDS spectrum of a Ag-Mg alloy wire is compared to a pure Ag spectrum in Fig. 1.


1987 ◽  
Vol 48 (10) ◽  
pp. 1623-1625 ◽  
Author(s):  
B. Farnoux ◽  
R. Kahn ◽  
A. Brulet ◽  
G. Collin ◽  
J.P. Pouget

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