Scanning microscopy by mid-infrared near-field scattering

1998 ◽  
Vol 66 (5) ◽  
pp. 477-481 ◽  
Author(s):  
B. Knoll ◽  
F. Keilmann
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Mid Infrared

Solvothermally Synthesized Sb2Te3Platelets Show Unexpected Optical Contrasts in Mid-Infrared Near-Field Scanning Microscopy

Nano Letters ◽  
2015 ◽  
Vol 15 (5) ◽  
pp. 2787-2793 ◽  
Author(s):  
Benedikt Hauer ◽  
Tobias Saltzmann ◽  
Ulrich Simon ◽  
Thomas Taubner
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Mid Infrared ◽  
Near Field Scanning

Tin diselenide van der Waals materials as new candidates for mid-infrared waveguide chips

Nanoscale ◽  
2019 ◽  
Vol 11 (30) ◽  
pp. 14113-14117 ◽  
Author(s):  
Mengfei Xue ◽  
Qi Zheng ◽  
Runkun Chen ◽  
Lihong Bao ◽  
Shixuan Du ◽  
...  
Keyword(s):  
Near Field ◽  
Van Der Waals ◽  
Building Blocks ◽  
Two Dimensional ◽  
Mid Infrared ◽  
Near Field Imaging ◽  
Van Der Waals Materials ◽  
Field Imaging

Near-field imaging of mid-infrared waveguide in SnSe2 slabs promotes two-dimensional van der Waals materials as building blocks for integrated MIR chips.

scholarly journals BaF2 Ridge Waveguide Operating at Mid-Infrared Wavelength

2021 ◽  
Vol 9 ◽  
Author(s):  
Yazhou Cheng ◽  
Xinbin Zhang ◽  
Hongxiao Song
Keyword(s):  
Ion Irradiation ◽  
Lattice Structure ◽  
Near Field ◽  
Annealing Treatment ◽  
Femtosecond Laser Ablation ◽  
Ridge Waveguide ◽  
Propagation Loss ◽  
Mid Infrared ◽  
Infrared Wavelength ◽  
Coupling System

We report on the fabrication of optical ridge waveguide in barium fluoride (BaF2) crystal by 15 MeV C5+ ions irradiation with femtosecond laser ablation. The near-field modal profile and propagation loss of the waveguide at mid-infrared wavelength 4 µm are investigated by using end-face coupling system. We implement a series of annealing treatment and it efficiently reduces the propagation loss of the waveguide. The confocal Raman spectra demonstrate that the lattice structure of BaF2 crystal does not change largely after C5+ ion irradiation.

scholarly journals Near-field imaging of the multi-resonant mode induced broadband tunable metamaterial absorber

RSC Advances ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 5146-5151 ◽  
Author(s):  
Lulu Chen ◽  
Liaoxin Sun ◽  
Hongxing Dong ◽  
Nanli Mou ◽  
Yaqiang Zhang ◽  
...  
Keyword(s):  
Infrared Absorption ◽  
Near Field ◽  
Resonant Mode ◽  
Metamaterial Absorber ◽  
Mid Infrared ◽  
Near Field Imaging ◽  
Metamaterial Absorbers ◽  
Tunable Metamaterial ◽  
Field Imaging

Metamaterial absorbers with tunability have broad prospects for mid-infrared absorption applications.

scholarly journals Single cell imaging with near‐field terahertz scanning microscopy

2020 ◽  
Vol 53 (4) ◽  
Author(s):  
Zaoxia Li ◽  
Shihan Yan ◽  
Ziyi Zang ◽  
Guoshuai Geng ◽  
Zhongbo Yang ◽  
...  
Keyword(s):  
Single Cell ◽  
Cell Imaging ◽  
Near Field ◽  
Scanning Microscopy ◽  
Single Cell Imaging

Photoconductive NSOM for mapping optoelectronic phases in nanostructures

Nanophotonics ◽  
2014 ◽  
Vol 3 (1-2) ◽  
pp. 19-31 ◽  
Author(s):  
Anshuman J. Das ◽  
Ravichandran Shivanna ◽  
K.S. Narayan
Keyword(s):  
Near Field ◽  
Functional Materials ◽  
Scanning Microscopy ◽  
Local Excitation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Current ◽  
Scanning Optical Microscopy ◽  
Microscopy Techniques ◽  
Current Monitoring

AbstractThe advent of optically functional materials with low-intensive processing methods is accompanied by a growing need for high resolution imaging to probe the inherent inhomogeneities in the underlying microstructure. Atomic force microscopy based techniques are typically utilized for imaging the surface of organic thin films, quantum dots and other nanomaterials with ultrahigh resolution. Several modes like conductive, Kelvin, electrostatic amongst others have been particularly successful in imaging the local current, potential and charge distribution of variety of systems. However, the functionality of photoconduction in these materials cannot be directly imaged by these modes alone. There is a requirement for a local excitation source or collection arrangement that is compatible with scanning microscopy techniques followed by a current monitoring mechanism. Near-field scanning optical microscopy (NSOM) possesses all the advantages of scanning microscopy and is capable of local excitation that overcomes the diffraction limit faced by conventional optical microscopes. Additionally, NSOM can be carried out on actual photoconductive two terminal and three terminal device structures to image local optoelectronic properties. In this review, we present the various geometries that have been demonstrated to perform photoconductive NSOM (p-NSOM). We highlight a representative set of important results and discuss the implications of photocurrent imaging in macroscopic device performance.

scholarly journals Spectroscopic near-field microscopy using frequency combs in the mid-infrared

2006 ◽  
Vol 14 (23) ◽  
pp. 11222 ◽  
Author(s):  
Markus Brehm ◽  
Albert Schliesser ◽  
Fritz Keilmann
Keyword(s):  
Near Field ◽  
Mid Infrared ◽  
Frequency Combs

Near‐field optical‐scanning microscopy

1986 ◽  
Vol 59 (10) ◽  
pp. 3318-3327 ◽  
Author(s):  
U. Dürig ◽  
D. W. Pohl ◽  
F. Rohner
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Optical Scanning
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