X-ray determination of the mean amplitudes of vibration and debye temperatures of some rare earth monochalcogenides

Pramana ◽  
1977 ◽  
Vol 9 (3) ◽  
pp. 223-227 ◽  
Author(s):  
KG Subhadra ◽  
DB Sirdeshmukh
1988 ◽  
Vol 139 (2) ◽  
pp. 241-247 ◽  
Author(s):  
B.Appa Rao ◽  
V.Bhaskara Sastry ◽  
P Kistaiah ◽  
K.Satyanarayana Murthy
Keyword(s):  
X Ray ◽  

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.


Pramana ◽  
1992 ◽  
Vol 38 (6) ◽  
pp. 681-683 ◽  
Author(s):  
K G Subhadra ◽  
B Raghavendra Rao ◽  
D B Sirdeshmukh
Keyword(s):  
X Ray ◽  

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