Differences of the mean square charge radii of the stable lead isotopes observed through electronicK X-ray shifts

1983 ◽  
Vol 73 (3) ◽  
pp. 273-294 ◽  
Author(s):  
G. L. Borchert ◽  
O. W. B. Schult ◽  
J. Speth ◽  
P. G. Hansen ◽  
B. Jonson ◽  
...  
2015 ◽  
Author(s):  
A. E. Barzakh ◽  
L. Kh. Batist ◽  
D. V. Fedorov ◽  
V. S. Ivanov ◽  
P. L. Molkanov ◽  
...  

1983 ◽  
Vol 44 (10) ◽  
pp. 985-989 ◽  
Author(s):  
H. Behr ◽  
H.M. Keppler ◽  
G. Steyrer ◽  
H. Metzger ◽  
J. Peisl

1978 ◽  
Vol 34 (6) ◽  
pp. 979-982 ◽  
Author(s):  
R. Chen ◽  
P. Trucano

The mean-square amplitudes of vibration in graphite based on an X-ray charge-density analysis are 0.0032 (2) and 0.0140 (3) Å2 parallel to and perpendicular to the basal plane, respectively. Values for the parallel vibrations of 0.0031 (6) and 0.0032 Å2 were derived from temperature-dependent neutron measurements and a calculated phonon spectrum. The neutron measurements and the phonon spectrum both predict lower values [0.0090 (20) and 0.0098 Å2] for the out-of-plane vibrations. This small discrepancy may be caused by small changes in the core atomic scattering factors from the free-atom values or by a deficiency in the phonon-spectrum model.


1986 ◽  
Vol 19 (3) ◽  
pp. 200-201 ◽  
Author(s):  
T. H. Metzger

The measurement of the mean-square thermal displacement 〈u 2〉 of carbon atoms in highly oriented pyrolytic graphite (HOPG) in the hexagonal c direction is reported. Energy-dispersive X-ray diffraction (EDXD) has been used to study the integrated intensity of all Bragg reflections 004 through 0′0′14 as a function of temperature. It is demonstrated that the correction of the Bragg intensities due to thermal diffuse scattering contributions is very important for HOPG, when EDXD is used. The Debye temperature ΘD = 554 (30) K is obtained.


2001 ◽  
Vol 672 ◽  
Author(s):  
Cristian E. Botez ◽  
William C. Elliott ◽  
Paul F. Miceli ◽  
Peter W. Stephens

ABSTRACTSynchrotron X-ray scattering was used to study the temperature and coverage dependence of the root-mean-square (rms) surface roughness, σ, during the homoepitaxial growth on Cu(001). At temperatures between 370 and 160K, the rms roughness was found to increase as a power law, σ =Θβ, with the coverage Θ. The roughness exponent, β, amounts to ∼1/2 for T≤200K, and it monotonically decreases with increasing T, reaching β∼1/3 at T=370K. The mean-square roughness measured at a constant coverage of 15ML, σ2 15 ML, also depends on the temperature of the substrate: between 370 and 200K, σ2 15 ML becomes progressively larger at lower temperatures, but at 110K a reentrant smoother growth is observed.


1977 ◽  
Vol 30 (1) ◽  
pp. 105 ◽  
Author(s):  
DW Field

The structure factors of 98 independent reflections have been determined by measurement of the integrated intensities for X-ray diffraction from a zinc single crystal at 295 K. The mean square vibration amplitudes found for the two principal directions are' compared with 'other recent measurements. The X-ray Debye temperature determined from the data' is 207 � 3 K at 295 K.


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