Study of electron energy and angular distributions and calculations of X-ray, EUV line flux and rise times

1987 ◽  
Vol 8 (3) ◽  
pp. 263-270 ◽  
Author(s):  
Ranjna Bakaya ◽  
Sunil Peshin ◽  
R. R. Rausaria ◽  
P. N. Khosa
1991 ◽  
Vol 67 (27) ◽  
pp. 3764-3767 ◽  
Author(s):  
R. Wehlitz ◽  
F. Heiser ◽  
O. Hemmers ◽  
B. Langer ◽  
A. Menzel ◽  
...  

1996 ◽  
Vol 23 (5) ◽  
pp. 675-684 ◽  
Author(s):  
J. O. Deasy ◽  
P. R. Almond ◽  
M. T. McEllistrem

Author(s):  
R. F. Egerton

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.


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