Effect of pressure on electrical resistance of WSe2 single crystal

Pramana ◽  
2003 ◽  
Vol 61 (1) ◽  
pp. 183-186 ◽  
Author(s):  
Rajiv Vaidya ◽  
Neha Bhatt ◽  
S. G. Patel ◽  
A. R. Jani ◽  
Alka B. Garg ◽  
...  
1969 ◽  
Vol 188 (3) ◽  
pp. 1156-1162 ◽  
Author(s):  
R. M. EMRICK ◽  
P. B. McARDLE

2012 ◽  
Vol 51 ◽  
pp. 105103 ◽  
Author(s):  
Tohru Watanabe ◽  
Fumiaki Tomioka ◽  
Satoshi Ishii ◽  
Shunsuke Tsuda ◽  
Takahide Yamaguchi ◽  
...  

Author(s):  
Timothy S. English ◽  
Leslie M. Phinney ◽  
Patrick E. Hopkins ◽  
Justin R. Serrano

Accurate thermal conductivity values are essential to the modeling, design, and thermal management of microelectromechanical systems (MEMS) and devices. However, the experimental technique best suited to measure thermal conductivity, as well as thermal conductivity itself, varies with the device materials, fabrication conditions, geometry, and operating conditions. In this study, the thermal conductivity of boron doped single-crystal silicon-on-insulator (SOI) microbridges is measured over the temperature range from 77 to 350 K. The microbridges are 4.6 mm long, 125 μm tall, and two widths, 50 or 85 μm. Measurements on the 85 μm wide microbridges are made using both steady-state electrical resistance thermometry and optical time-domain thermoreflectance. A thermal conductivity of ∼ 77 W/mK is measured for both microbridge widths at room temperature, where both experimental techniques agree. However, a discrepancy at lower temperatures is attributed to differences in the interaction volumes and in turn, material properties, probed by each technique. This finding is qualitatively explained through Boltzmann transport equation modeling under the relaxation time approximation.


2016 ◽  
Vol 119 (13) ◽  
pp. 135903 ◽  
Author(s):  
Takaki Muramatsu ◽  
Lev V. Gasparov ◽  
Helmuth Berger ◽  
Russell J. Hemley ◽  
Viktor V. Struzhkin

2012 ◽  
Vol 68 (3) ◽  
pp. 275-286 ◽  
Author(s):  
Boris A. Zakharov ◽  
Boris A. Kolesov ◽  
Elena V. Boldyreva

Information on the effect of pressure on hydrogen bonds, which could be derived from single-crystal X-ray diffraction at a laboratory source and polarized Raman spectroscopy, has been compared. L-Serine and DL-serine were selected for this case study. The role of hydrogen bonds in pressure-induced phase transitions in the first system and in the structural stability of the second one are discussed. Non-monotonic distortion of selected hydrogen bonds in the pressure range below ∼ 1–2 GPa, a change in the compression mechanism at ∼ 2–3 GPa, and the evidence of formation of bifurcated N—H...O hydrogen bonds in DL-serine at ∼ 3–4 GPa are considered.


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