scholarly journals Modelling, analysis, and acceleration of a printed circuit board fabrication process

Sadhana ◽  
2001 ◽  
Vol 26 (5) ◽  
pp. 447-463
Author(s):  
K. S. Aithal ◽  
Y. Narahari ◽  
E. Manjunath
2013 ◽  
Vol 647 ◽  
pp. 929-934 ◽  
Author(s):  
Yaw Jen Chang ◽  
Yun Wei Chung ◽  
Ting An Chou ◽  
Min Fen Huang

In this paper, a micropump with electromagnetic actuation is presented. The micropump mainly consists of coil actuators and a PDMS micropump layer. The microcoil was fabricated using the printed circuit board (PCB) with the conventional PCB treatment and the PDMS layer was formed by casting technique. A control circuit was designed using microcontroller to produce square waves to control coil actuator. Due to the simple fabrication process, the micropump can be incorporated in a disposable PDMS lab-on-a-chip device as a fluid actuation component. However, the coil actuator is reusable. In addition, the control circuit makes the micropump portable. The experiment results show that this proposed micropump is capable of delivering a flow rate of 470 μL/min using one coil actuator.


2010 ◽  
Vol 52 (12) ◽  
pp. 2636-2639
Author(s):  
Seong-Sik Myoung ◽  
Seon-Il Kim ◽  
Joo-Yong Jung ◽  
Dae-Ho Lim ◽  
Jeensang Jang ◽  
...  

2011 ◽  
Vol 87 ◽  
pp. 140-145 ◽  
Author(s):  
Chadchawarn Phongsomboon ◽  
Kreeta Sukhthang ◽  
Wishsanuruk Wechsatol ◽  
Adisorn Tuantranont ◽  
Tanom Lomas

In this work, an electro-wetting on dielectric device (EWOD) with array style electrodes was fabricated from low price and common electronic materials. With its low cost and uncomplicated fabrication process, it is useful and feasible in teaching and educating young engineers on such droplet movement technique. The array electrodes were made from a common printed circuit board and copper tapes. The applied fabrication technique is mentioned in this paper. The water droplet movement in corresponding to the applied frequencies and voltage is reported.


2012 ◽  
Vol 132 (6) ◽  
pp. 404-410 ◽  
Author(s):  
Kenichi Nakayama ◽  
Kenichi Kagoshima ◽  
Shigeki Takeda

2014 ◽  
Vol 5 (1) ◽  
pp. 737-741
Author(s):  
Alejandro Dueñas Jiménez ◽  
Francisco Jiménez Hernández

Because of the high volume of processing, transmission, and information storage, electronic systems presently requires faster clock speeds tosynchronizethe integrated circuits. Presently the “speeds” on the connections of a printed circuit board (PCB) are in the order of the GHz. At these frequencies the behavior of the interconnects are more like that of a transmission line, and hence distortion, delay, and phase shift- effects caused by phenomena like cross talk, ringing and over shot are present and may be undesirable for the performance of a circuit or system.Some of these phrases were extracted from the chapter eight of book “2-D Electromagnetic Simulation of Passive Microstrip Circuits” from the corresponding author of this paper.


Author(s):  
Prabjit Singh ◽  
Ying Yu ◽  
Robert E. Davis

Abstract A land-grid array connector, electrically connecting an array of plated contact pads on a ceramic substrate chip carrier to plated contact pads on a printed circuit board (PCB), failed in a year after assembly due to time-delayed fracture of multiple C-shaped spring connectors. The land-grid-array connectors analyzed had arrays of connectors consisting of gold on nickel plated Be-Cu C-shaped springs in compression that made electrical connections between the pads on the ceramic substrates and the PCBs. Metallography, fractography and surface analyses revealed the root cause of the C-spring connector fracture to be plating solutions trapped in deep grain boundary grooves etched into the C-spring connectors during the pre-plating cleaning operation. The stress necessary for the stress corrosion cracking mechanism was provided by the C-spring connectors, in the land-grid array, being compressed between the ceramic substrate and the printed circuit board.


Author(s):  
William Ng ◽  
Kevin Weaver ◽  
Zachary Gemmill ◽  
Herve Deslandes ◽  
Rudolf Schlangen

Abstract This paper demonstrates the use of a real time lock-in thermography (LIT) system to non-destructively characterize thermal events prior to the failing of an integrated circuit (IC) device. A case study using a packaged IC mounted on printed circuit board (PCB) is presented. The result validated the failing model by observing the thermal signature on the package. Subsequent analysis from the backside of the IC identified a hot spot in internal circuitry sensitive to varying value of external discrete component (inductor) on PCB.


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