Liquid water fade margin requirements for infrared and millimeter wave runway imaging sensors in fog

1997 ◽  
Vol 18 (6) ◽  
pp. 1133-1149
Author(s):  
Robert E. Marshall ◽  
David A. de Wolf ◽  
Christos Kontogeorgakis
Keyword(s):  
Millimeter Wave ◽  
Liquid Water ◽  
Margin Requirements ◽  
Imaging Sensors

Passive millimeter wave imaging sensors for commercial markets

2010 ◽  
Vol 49 (19) ◽  
pp. E7 ◽  
Author(s):  
Jonathan J. Lynch ◽  
Perry A. Macdonald ◽  
Harris P. Moyer ◽  
Robert G. Nagele
Keyword(s):  
Millimeter Wave ◽  
Millimeter Wave Imaging ◽  
Commercial Markets ◽  
Wave Imaging ◽  
Imaging Sensors ◽  
Passive Millimeter Wave Imaging

scholarly journals Millimeter Wave Multi-Port Interferometric Radar Sensors: Evolution of Fabrication and Characterization Technologies

Sensors ◽  
2020 ◽  
Vol 20 (19) ◽  
pp. 5477
Author(s):  
Serioja Ovidiu Tatu ◽  
Emilia Moldovan
Keyword(s):  
Millimeter Wave ◽  
Antenna Arrays ◽  
High Speed ◽  
Low Cost ◽  
Radar Sensors ◽  
Laboratory Characterization ◽  
Calibration Methods ◽  
High Efficient ◽  
Fabrication And Characterization ◽  
Imaging Sensors

Recent advances in millimeter wave technologies, both in component and system design, in line with important size and cost reductions, have opened up new applications in ultra-high-speed wireless communications, radar and imaging sensors. The paper presents the evolution of millimeter wave circuit and modules fabrication and characterization technologies in the past decades. Novel planar low-cost fabrication technologies have been successfully developed in this period. In combination with the standard rectangular wave-guide technology, these offer great opportunities for prototyping and testing of future millimeter wave transceivers or front-ends, which integrate antenna arrays, down-converters, modulators, amplifiers, etc., in a compact fixture. The paper uses, as a suggestive example, the evolution of the multi-port interferometric front-ends implementation from millimeter wave bulky components and systems to miniaturized and high-efficient ones. Circuit and system designs are carefully done to avoid (as much as possible) complicated calibration methods or difficult post-processing of baseband data. This requires an increased effort in design and fabrication, but it allows miniaturization, low-power consumption, while keeping very good overall performances. Useful and straightforward laboratory characterization techniques of circuits and systems are described in detail.

Thin Film Inspection with Millimeter-Wave Reflectometer

1995 ◽  
Vol 7 (1) ◽  
pp. 89-100
Author(s):  
H. C. Han ◽  
E. S. Mansueto
Keyword(s):  
Thin Film ◽  
Millimeter Wave
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