A new method for glyceride composition determination by colorimetry

1981 ◽  
Vol 58 (5) ◽  
pp. 613-617 ◽  
Author(s):  
J. Dasgupta ◽  
D. Bhattacharyya ◽  
M. M. Chakrabarty ◽  
S. Adhikari
Keyword(s):  
New Method ◽  
Glyceride Composition ◽  
Composition Determination

scholarly journals New method for initial composition determination of crystallized silicate melt inclusions

2018 ◽  
Vol 483 ◽  
pp. 162-173 ◽  
Author(s):  
Laura Créon ◽  
Gilles Levresse ◽  
Laurent Remusat ◽  
Hélène Bureau ◽  
Gerardo Carrasco-Núñez
Keyword(s):  
Melt Inclusions ◽  
New Method ◽  
Silicate Melt ◽  
Initial Composition ◽  
Composition Determination

Selective Sampling and Orientation of Non-Homogeneous Tissues

1968 ◽  
Vol 26 ◽  
pp. 98-99
Author(s):  
C. C. Clawson ◽  
L. W. Anderson ◽  
R. A. Good
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Light Microscopy ◽  
Random Sampling ◽  
New Method ◽  
Microscope Examination ◽  
Small Areas ◽  
Selective Sampling ◽  
Large Numbers ◽  
Specific Orientation

Investigations which require electron microscope examination of a few specific areas of non-homogeneous tissues make random sampling of small blocks an inefficient and unrewarding procedure. Therefore, several investigators have devised methods which allow obtaining sample blocks for electron microscopy from region of tissue previously identified by light microscopy of present here techniques which make possible: 1) sampling tissue for electron microscopy from selected areas previously identified by light microscopy of relatively large pieces of tissue; 2) dehydration and embedding large numbers of individually identified blocks while keeping each one separate; 3) a new method of maintaining specific orientation of blocks during embedding; 4) special light microscopic staining or fluorescent procedures and electron microscopy on immediately adjacent small areas of tissue.

Corrections for surface films in microanalysis by EDS and EELS

1992 ◽  
Vol 50 (2) ◽  
pp. 1230-1231
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Hydrocarbon Contamination ◽  
Specimen Preparation ◽  
Surface Films ◽  
Ion Milling ◽  
Preferential Sputtering ◽  
Electron Energy Loss Spectrometry ◽  
Composition Determination ◽  
Analytical Electron ◽  
First Order Correction ◽  
Electron Energy Loss

Common artifacts on analytical electron microscope (AEM) specimens prepared from bulk materials are surface films with altered structure and composition that result from electropolishing, oxidation, hydrocarbon contamination, or ion milling (preferential sputtering or deposition of sputtered specimen or support material). Of course, the best solution for surface films is to avoid them by improved specimen preparation and handling procedures or to remove them by low energy ion sputter cleaning, a capability that already exists on some specialized AEMs and one that is likely to become increasingly common. However, the problem remains and it is surprising that surface films have not received more attention with respect to composition determination by energy dispersive X-ray spectrometry (EDS) and electron energy loss spectrometry (EELS).For EDS, an effective first-order correction to remove the contribution of surface films on wedge shaped specimens is to subtract from the spectrum of interest a spectrum obtained under identical conditions (probe current, diffracting conditions, acquisition live time) from a thinner region of the specimen.

A new method for the determination of nitrates

1960 ◽  
Vol 23 ◽  
pp. 227-232 ◽  
Author(s):  
P WEST ◽  
G LYLES
Keyword(s):  
New Method
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