Effect of ion dose rate on rapid laser annealing of implanted GaAs

1996 ◽  
Vol 25 (1) ◽  
pp. 3-5 ◽  
Author(s):  
K. Masuda ◽  
K. Murakami ◽  
H. Y. Nan
1980 ◽  
Vol 1 ◽  
Author(s):  
J.S. Williams ◽  
A. P. Pogany ◽  
D. G. Beanland ◽  
D. J. Chivers ◽  
M. J. Kenny ◽  
...  

ABSTRACTHigh resolution Rutherford backscattering and channelling TEM and electrical measurements have been employed to investigate pulsed-ruby laser annealing effects in high dose rate ion implanted silicon wafers. The laterally non-uniform, part amorphous, part crystalline disordered structure which can result from high dose rate implants has been utilized to investigate the selective removal of amorphous or crystalline damage at near-threshold laser powers. Evidence is found for preferrential recrystallisation of amorphous damage regions over a broad laser power window which is below the threshold power required to melt adjacent crystalline silicon. At laser power levels above the crystalline-to-melt threshold, excellent uniformity in damage removal and electrical properties were obtained over the entire wafer.


2017 ◽  
Vol 70 (8) ◽  
pp. 809-815 ◽  
Author(s):  
Nam-Hoon Kim ◽  
Pil Ju Ko ◽  
Geum-Bae Cho ◽  
Chan Il Park

1988 ◽  
Vol 27 (Part 2, No. 4) ◽  
pp. L619-L621 ◽  
Author(s):  
Toshiharu Minamikawa ◽  
Yasuto Yonezawa ◽  
Shigeru Otsubo ◽  
Toshihiro Maeda ◽  
Akihiro Moto ◽  
...  

2017 ◽  
Vol 5 (6) ◽  
pp. 1336-1345 ◽  
Author(s):  
H. J. Meadows ◽  
S. Misra ◽  
B. J. Simonds ◽  
M. Kurihara ◽  
T. Schuler ◽  
...  

Rapid laser annealing converts CuInSe2precursors into working semiconductors only when the precursor has suitable optical and microstructural properties.


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1325-C8-1326
Author(s):  
P. Sánchez ◽  
M. C. Sánchez ◽  
E. López ◽  
M. García ◽  
C. Aroca

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