Application of spectroscopic ellipsometry for real-time control of CdTe and HgCdTe growth in an OMCVD system
1995 ◽
Vol 24
(5)
◽
pp. 445-449
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Keyword(s):
1995 ◽
Vol 24
(9)
◽
pp. 1087-1091
◽
Keyword(s):
Keyword(s):
2007 ◽
Vol 73
(12)
◽
pp. 1369-1374