Structural characterization of oxide layers thermally grown on 3C-SiC films

1995 ◽  
Vol 24 (10) ◽  
pp. 1345-1348 ◽  
Author(s):  
Q. Wahab ◽  
L. Hultman ◽  
M. Willander ◽  
J. -E. Sundgren
Keyword(s):  
Structural Characterization ◽  
Oxide Layers ◽  
Sic Films ◽  
Thermally Grown

Structural Characterization of Thin 3C-SiC Films Annealed by the Flash Lamp Process

2004 ◽  
Vol 457-460 ◽  
pp. 351-354 ◽  
Author(s):  
Efstathios K. Polychroniadis ◽  
J. Stoemenos ◽  
Gabriel Ferro ◽  
Yves Monteil ◽  
D. Panknin ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Flash Lamp ◽  
Sic Films

Structural characterization of nanometer SiC films grown on Si

1993 ◽  
Vol 62 (24) ◽  
pp. 3135-3137 ◽  
Author(s):  
J. P. Li ◽  
A. J. Steckl ◽  
I. Golecki ◽  
F. Reidinger ◽  
L. Wang ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Sic Films

Structural characterization of SiC films prepared by dynamic ion mixing

1996 ◽  
Vol 287 (1-2) ◽  
pp. 1-7 ◽  
Author(s):  
M. Zaytouni ◽  
J.P. Riviere ◽  
M.F. Denanot ◽  
J. Allain
Keyword(s):  
Structural Characterization ◽  
Sic Films

Structural characterization of nano-oxide layers in PtMn based specular spin valves

2005 ◽  
Vol 97 (10) ◽  
pp. 10N706 ◽  
Author(s):  
Min Zhou ◽  
Lifan Chen ◽  
Zhitao Diao ◽  
Chang-Man Park ◽  
Yiming Huai
Keyword(s):  
Structural Characterization ◽  
Spin Valves ◽  
Oxide Layers ◽  
Nano Oxide

New ultrastructural findings about Borrelia burgdorferi by cryofixation, negative staining, thin sectioning and scanning techniques

1990 ◽  
Vol 48 (3) ◽  
pp. 582-583
Author(s):  
S. F. Hayes ◽  
M. D. Corwin ◽  
T. G. Schwan ◽  
D. W. Dorward ◽  
W. Burgdorfer
Keyword(s):  
Lyme Disease ◽  
Borrelia Burgdorferi ◽  
Structural Characterization ◽  
Negative Staining ◽  
Low Speed ◽  
Thin Sectioning ◽  
Ultrastructural Findings

Characterization of Borrelia burgdorferi strains by means of negative staining EM has become an integral part of many studies related to the biology of the Lyme disease organism. However, relying solely upon negative staining to compare new isolates with prototype B31 or other borreliae is often unsatisfactory. To obtain more satisfactory results, we have relied upon a correlative approach encompassing a variety EM techniques, i.e., scanning for topographical features and cryotomy, negative staining and thin sectioning to provide a more complete structural characterization of B. burgdorferi.For characterization, isolates of B. burgdorferi were cultured in BSK II media from which they were removed by low speed centrifugation. The sedimented borrelia were carefully resuspended in stabilizing buffer so as to preserve their features for scanning and negative staining. Alternatively, others were prepared for conventional thin sectioning and for cryotomy using modified procedures. For thin sectioning, the fixative described by Ito, et al.

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