Single event upset and total dose radiation effects on rad-hard SRAMs

V. Zajic; K. Kloesel; D. Ngo; P. M. Kibuule; A. Oladipupo; T. N. Fogarty; R. A. Kohler; E. G. Stassinopulos

doi:10.1007/bf02655237

Single event upset and total dose radiation effects on rad-hard SRAMs

Journal of Electronic Materials ◽

10.1007/bf02655237 ◽

1990 ◽

Vol 19 (7) ◽

pp. 689-697

Author(s):

V. Zajic ◽

K. Kloesel ◽

D. Ngo ◽

P. M. Kibuule ◽

A. Oladipupo ◽

...

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Single Event Upset ◽

Single Event ◽

Dose Radiation

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Comparative measurements of single event upset and total dose environments using the CREAM instruments

. RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems ◽

10.1109/radecs.1991.213587 ◽

2002 ◽

Author(s):

C.S. Dyer ◽

A.J. Sims ◽

J. Farren ◽

J. Stephen ◽

C. Underwood

Keyword(s):

Total Dose ◽

Single Event Upset ◽

Single Event

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Timing and Area Optimization of CMOS Combinational-Logic Circuits Accounting for Total-Dose Radiation Effects

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1987.4337485 ◽

1987 ◽

Vol 34 (6) ◽

pp. 1386-1391 ◽

Cited By ~ 3

Author(s):

R. S. Gyurcsik ◽

D. W. Thomas ◽

R. H. Gallimore ◽

B. L. Bhuva ◽

S. E. Kerns

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Logic Circuits ◽

Combinational Logic ◽

Combinational Logic Circuits ◽

Area Optimization ◽

Dose Radiation

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Models for Total-Dose Radiation Effects in Non-Volatile Memory

10.2172/1365509 ◽

2017 ◽

Author(s):

Philip Montgomery Campbell ◽

Steven D. Wix

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Non Volatile Memory ◽

Volatile Memory ◽

Dose Radiation

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Comparative measurements of single event upset and total dose environments using the CREAM instruments

IEEE Transactions on Nuclear Science ◽

10.1109/23.277528 ◽

1992 ◽

Vol 39 (3) ◽

pp. 413-417 ◽

Cited By ~ 9

Author(s):

C.S. Dyer ◽

A.J. Sims ◽

J. Farren ◽

J. Stephen ◽

C. Underwood

Keyword(s):

Total Dose ◽

Single Event Upset ◽

Single Event

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Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960447 ◽

2002 ◽

Cited By ~ 3

Author(s):

K. Hirose ◽

H. Saito ◽

M. Akiyama ◽

M. Arakaki ◽

Y. Kuroda ◽

...

Keyword(s):

Total Dose ◽

Single Event Upset ◽

Single Event ◽

Design Rules

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Total dose radiation effects of hybrid bulk/SOI CMOS active pixel with buried channel SOI source follower

Microelectronics Journal ◽

10.1016/j.mejo.2014.02.021 ◽

2014 ◽

Vol 45 (4) ◽

pp. 477-481 ◽

Cited By ~ 2

Author(s):

Xiao-liang Yang ◽

Ying Wang ◽

Bin Du ◽

Cheng-hao Yu

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Buried Channel ◽

Active Pixel ◽

Source Follower ◽

Dose Radiation ◽

Soi Cmos

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Simulating total-dose radiation effects on circuit behavior

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307814 ◽

1994 ◽

Cited By ~ 3

Author(s):

R. Tu ◽

G. Lum ◽

P. Pavan ◽

Ping Ko ◽

Chenming Hu

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Dose Radiation

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A Comparison of Avalanche Injection of Holes and Total Dose Radiation Effects in RadFETs

ECS Transactions ◽

10.1149/1.3360766 ◽

2019 ◽

Vol 27 (1) ◽

pp. 1159-1163 ◽

Cited By ~ 3

Author(s):

Hao Tang ◽

Yi Wang ◽

Jinyan Wang ◽

Yijun Zheng ◽

Yufeng Jin

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Dose Radiation

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γ-Ray Total Dose Radiation Effects of Pt/PbZr0.52Ti0.48/Pt and Au/PbTiO3/YBa2Cu3O7-δFerroelectric Capacitors

Japanese Journal of Applied Physics ◽

10.1143/jjap.37.5126 ◽

1998 ◽

Vol 37 (Part 1, No. 9B) ◽

pp. 5126-5127 ◽

Cited By ~ 9

Author(s):

Jianxia Gao ◽

Lirong Zheng ◽

Jianming Zeng ◽

Chenglu Lin

Keyword(s):

Total Dose ◽

Radiation Effects ◽

Γ Ray ◽

Dose Radiation

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Effects of Total Dose Irradiation on Single-Event Upset Hardness

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2006.877896 ◽

2006 ◽

Vol 53 (4) ◽

pp. 1772-1778 ◽

Cited By ~ 40

Author(s):

J.R. Schwank ◽

M.R. Shaneyfelt ◽

J.A. Felix ◽

P.E. Dodd ◽

J. Baggio ◽

...

Keyword(s):

Total Dose ◽

Single Event Upset ◽

Single Event ◽

Dose Irradiation

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