Determination of surface states distribution in a-Si:H using MOS tunnel Junctions

1980 ◽  
Vol 9 (4) ◽  
pp. 797-818 ◽  
Author(s):  
I. Balberg
Keyword(s):  
Tunnel Junctions ◽  
Surface States

Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions

2006 ◽  
Vol 35 (12) ◽  
pp. 2142-2146 ◽  
Author(s):  
J. Joshua Yang ◽  
Chengxiang Ji ◽  
Ying Yang ◽  
Y. Austin Chang ◽  
Feng X. Liu ◽  
...  
Keyword(s):  
Tunnel Junctions ◽  
Oxide Films ◽  
Magnetic Tunnel Junctions ◽  
Thickness Determination ◽  
Ultrathin Oxide Films ◽  
Ultrathin Oxide

Precise determination of absolute coverage of thin films by layer-resolved surface states

2008 ◽  
Vol 92 (16) ◽  
pp. 163102 ◽  
Author(s):  
Cheng-Maw Cheng ◽  
Ku-Ding Tsuei ◽  
Chi-Ting Tsai ◽  
Dah-An Luh
Keyword(s):  
Thin Films ◽  
Surface States ◽  
Precise Determination

New method for determination of energy distribution of surface states in the semiconductor band-gap: XPS measurements under biases

1994 ◽  
Vol 92 (3) ◽  
pp. 249-254 ◽  
Author(s):  
Hikaru Kobayashi ◽  
Toshio Mori ◽  
Kenji Namba ◽  
Yoshihiro Nakato
Keyword(s):  
Energy Distribution ◽  
Band Gap ◽  
Surface States ◽  
New Method

Determination of the surface states from the ultrafast electronic states in the thermoelectric material YbCd2Sb2

2021 ◽  
Author(s):  
Tongyao Wu ◽  
Hongyuan Wang ◽  
Yuanyuan Yang ◽  
Shaofeng Duan ◽  
Chaozhi Huang ◽  
...  
Keyword(s):  
Thermoelectric Material ◽  
Electronic States ◽  
Surface States
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