Ion-implantation induced phase transitions: Order-disorder and amorphous-crystal transformations (CEMS studies)

1986 ◽  
Vol 29 (1-4) ◽  
pp. 1179-1182 ◽  
Author(s):  
A. Fnidiki ◽  
D. Bodin ◽  
J. P. Eymery
1986 ◽  
Vol 95 (2) ◽  
pp. 385-390 ◽  
Author(s):  
M. I. Guseva ◽  
G. V. Goedeeva

1979 ◽  
Vol 1 (1) ◽  
pp. 23-33 ◽  
Author(s):  
E. Johnson ◽  
T. Wohlenberg ◽  
W. A. Grant

1993 ◽  
Vol 74 (7) ◽  
pp. 4792-4794 ◽  
Author(s):  
Z. Rao ◽  
J. S. Williams ◽  
D. K. Sood

1994 ◽  
Vol 354 ◽  
Author(s):  
Laurence A. Gea ◽  
L. A. Boatner ◽  
Janet Rankin ◽  
J. D. Budai

AbstractThe oxides of vanadium VO2 and V2O3 are of fundamental and practical interest since they undergo structural phase transitions during which large variations in their optical and electronic properties are observed. In the present work, we report the formation of buried precipitates of V2O3 in sapphire by ion implantation and thermal annealing. It was found that the co-implantation of oxygen and vanadium was required in order to form nanophase V2O3 precipitates. Additionally, these precipitates, which formed only following an anneal of the co-implanted sample under reducing conditions, are coherent with the sapphire lattice. Two epitaxial relationships were observed: (0001)V2O3//(0001) ɑ-Al2O3 and (11-20)V2O3//(0001) ɑ-Al2O3. This finding is in agreement with results obtained elsewhere for thin films of V2O3 deposited on c-axis-oriented sapphire.


Author(s):  
P. Ling ◽  
R. Gronsky ◽  
J. Washburn

The defect microstructures of Si arising from ion implantation and subsequent regrowth for a (111) substrate have been found to be dominated by microtwins. Figure 1(a) is a typical diffraction pattern of annealed ion-implanted (111) Si showing two groups of extra diffraction spots; one at positions (m, n integers), the other at adjacent positions between <000> and <220>. The object of the present paper is to show that these extra reflections are a direct consequence of the microtwins in the material.


Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.


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