A brief history of the Inertial Confinement Fusion Advisory Committee (ICFAC)

1994 ◽  
Vol 13 (2-3) ◽  
pp. 177-179
Author(s):  
Marshall M. Sluyter
1995 ◽  
Vol 13 (4) ◽  
pp. 539-557 ◽  
Author(s):  
I.V. Aleksandrova ◽  
E.R. Koresheva ◽  
I.E. Osipov ◽  
L.V. Panina

The physics of the formation of cryogenic fuel layers with various internal structures has been studied in regard to the development of promising layering techniques for modern inertial confinement fusion (ICF) experiments. The investigations have been made with inertial confinement fusion target (ICF targets) and in a target modeling system (TMS) with the nonisochoric process of cryogenic layer formation. The results indicate that the solidlayer structure in TMS differs essentially from that obtained in ICF targets. The thermal history of a fuel layer at separation into the condensed and vapor phases is found to depend upon whether the initial gas density is more, less, or equal to the critical value for a given fuel material. The issue on the fuel-layer fabrication in the form of a long-living quasiamorphous layer is considered. A new low-temperature method to homogenize a polycrystalline cryogenic layer has been proposed and examined. The operational temperature was 4.2 K. The time to achieve the complete homogeneity of solid hydrogen was 150 s. No limitation, with respect to the thickness of a cryogenic layer, was found. The critical target is suggested as a new type of an ICF target.


Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2020 ◽  
Vol 36 ◽  
pp. 100749 ◽  
Author(s):  
R.E. Olson ◽  
R.J. Leeper ◽  
S.H. Batha ◽  
R.R. Peterson ◽  
P.A. Bradley ◽  
...  

2021 ◽  
Vol 28 (3) ◽  
pp. 032713
Author(s):  
Dongguo Kang ◽  
Huasen Zhang ◽  
Shiyang Zou ◽  
Wudi Zheng ◽  
Shaoping Zhu ◽  
...  

2021 ◽  
Vol 92 (7) ◽  
pp. 073505
Author(s):  
T. J. Awe ◽  
L. Perea ◽  
J. C. Hanson ◽  
A. J. York ◽  
D. W. Johnson ◽  
...  

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