Direct determination of a topmost atomic layer of (100) surfaces on (La 0.3 Sr 0.7 )(Al 0.65 Ta 0.35 )O 3 single crystals annealed in air by high‐resolution scanning transmission electron microscopy

2021 ◽  
Author(s):  
Yoshinori Tokuda ◽  
Takeshi Irimoto ◽  
Naoki Nishikawa ◽  
Yutaro Katsuyama ◽  
Shunsuke Kobayashi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Single Crystals ◽  
Scanning Transmission Electron Microscopy ◽  
Direct Determination ◽  
Atomic Layer ◽  
Transmission Electron ◽  
Scanning Transmission

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

2008 ◽  
Vol 112 (6) ◽  
pp. 1759-1763 ◽  
Author(s):  
Norihiko L. Okamoto ◽  
Bryan W. Reed ◽  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
David Gene Morgan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Microscopy Images
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