A radioreagent method for determination of traces of phosphorus in high-purity silicon

1985 ◽  
Vol 90 (2) ◽  
pp. 239-245
Author(s):  
P. Y. Chen ◽  
J. S. Chen ◽  
H. J. Sun ◽  
M. H. Yang
Keyword(s):  
High Purity ◽  
High Purity Silicon ◽  
Radioreagent Method

Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

2015 ◽  
Vol 30 (4) ◽  
pp. 909-915 ◽  
Author(s):  
Zheng Wang ◽  
Junye Zhang ◽  
Guoxia Zhang ◽  
Deren Qiu ◽  
Pengyuan Yang
Keyword(s):  
Silicon Nitride ◽  
High Purity ◽  
Inductively Coupled Plasma ◽  
Direct Determination ◽  
Optical Emission ◽  
Emission Spectrometry ◽  
Trace Impurities ◽  
High Purity Silicon ◽  
Slurry Nebulization

A simple, rapid and reliable method was developed for the determination of trace impurities in high-purity silicon nitride (nm- and μm-sized) by ICP-OES using a slurry nebulization technique.

Spectrophotometric Determination of Traces of Boron in High Purity Silicon

1989 ◽  
Vol 22 (8) ◽  
pp. 1961-1967 ◽  
Author(s):  
D. C. Parashar ◽  
A. K. Sarkar ◽  
Niranjan Singh
Keyword(s):  
Spectrophotometric Determination ◽  
High Purity ◽  
High Purity Silicon

Determination of contaminants in high-purity silicon by nondestructive activation analysis

1968 ◽  
Vol 24 (5) ◽  
pp. 520-523 ◽  
Author(s):  
Ya. Boganch ◽  
P. Kvittner ◽  
E. Sabo
Keyword(s):  
Activation Analysis ◽  
High Purity ◽  
High Purity Silicon
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