Binary diffusion and heat transfer in laminar mixed convection channel flows with uniform wall heat flux: extremely thin film thickness

1991 ◽  
Vol 26 (1) ◽  
pp. 23-31 ◽  
Author(s):  
H. C. Tsay ◽  
W. M. Yan
2018 ◽  
Vol 22 (2) ◽  
pp. 899-897
Author(s):  
Xiaohong Gui ◽  
Xiange Song ◽  
Baisheng Nie

The effects of contact angle and superheat on thin-film thickness and heat flux distribution occurring in a rectangle microgroove are numerically simulated. Accordingly, physical, and mathematical models are built in detail. Numerical results indicate that meniscus radius and thin-film thickness increase with the improvement of contact angle. The heat flux distribution in the thin-film region increases non-linearly as the contact angle decreases. The total heat transfer through the thin-film region increases with the improvement of superheat, and decreases as the contact angle increases. When the contact angle is equal to zero, the heat transfer in the thin-film region accounts for more than 80% of the total heat transfer. Intensive evaporation in the thin-film region plays a key role in heat transfer for the rectangle capillary microgroove. The liquid with higher wetting performance is more capable of playing the advantages of higher intensity heat transfer in thin- film region. The current investigation will result in a better understanding of thin- -film evaporation and its effect on the effective thermal conductivity in the rectangle microgroove.


1981 ◽  
Vol 103 (2) ◽  
pp. 325-330 ◽  
Author(s):  
R. Cook ◽  
C. Y. Tung ◽  
P. C. Wayner

A scanning microphotometer was used to measure in situ the profile of an evaporating decane meniscus in the contact line region on a smooth inclined silicon substrate as a function of the evaporative heat flux. The use of this new experimental design to determine the effect of heat flux on the profile in the contact line region is discussed. The results support the hypothesis that fluid flow in the contact line region of an evaporating thin film results from a change in the thin film thickness profile.


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